ISO_7637-2_2004_PDF

Reference number ISO 7637-2:2004(E) © ISO 2004 INTERNATIONAL STANDARD ISO 7637-2 Second edition 2004-06-15 Corrected version 2004-09-15 Road vehicles — Electrical disturbances from conduction and coupling — Part 2: Electrical transient conduction along supply lines only Véhicules routiers — Perturbations électriques par conduction et par couplage — Partie 2: Transmission des perturbations électriques transitoires par conduction uniquement le long des lignes d'alimentation Licensed to ADVANCE DATA TECHNOLOGY CORP./EDWARD CHIUEH ISO Store order #: 662289/Downloaded: 2005-04-06 Single user licence only, copying and networking prohibited ISO 7637-2:2004(E) PDF disclaimer This PDF file may contain embedded typefaces. In accordance with Adobe's licensing policy, this file may be printed or viewed but shall not be edited unless the typefaces which are embedded are licensed to and installed on the computer performing the editing. In downloading this file, parties accept therein the responsibility of not infringing Adobe's licensing policy. The ISO Central Secretariat accepts no liability in this area. Adobe is a trademark of Adobe Systems Incorporated. Details of the software products used to create this PDF file can be found in the General Info relative to the file; the PDF-creation parameters were optimized for printing. Every care has been taken to ensure that the file is suitable for use by ISO member bodies. In the unlikely event that a problem relating to it is found, please inform the Central Secretariat at the address given below. © ISO 2004 All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either ISO at the address below or ISO's member body in the country of the requester. ISO copyright office Case postale 56 • CH-1211 Geneva 20 Tel. + 41 22 749 01 11 Fax + 41 22 749 09 47 E-mail copyright@iso.org Web www.iso.org Published in Switzerland ii © ISO 2004 – All rights reserved Licensed to ADVANCE DATA TECHNOLOGY CORP./EDWARD CHIUEH ISO Store order #: 662289/Downloaded: 2005-04-06 Single user licence only, copying and networking prohibited ISO 7637-2:2004(E) © ISO 2004 – All rights reserved iii Contents Page Foreword............................................................................................................................................................ iv 1 Scope...................................................................................................................................................... 1 2 Normative references ........................................................................................................................... 1 3 Terms and definitions........................................................................................................................... 1 4 Test procedure ...................................................................................................................................... 1 4.1 General ................................................................................................................................................... 1 4.2 Test temperature and test voltage ...................................................................................................... 2 4.3 Voltage transient emissions test......................................................................................................... 2 4.4 Transient immunity test........................................................................................................................ 4 5 Test instrument description and specifications ................................................................................ 6 5.1 Artificial network ................................................................................................................................... 6 5.2 Shunt resistor Rs ................................................................................................................................... 6 5.3 Switch S ................................................................................................................................................. 7 5.4 Power supply......................................................................................................................................... 8 5.5 Measurement instrumentation............................................................................................................. 8 5.5.1 Oscilloscope.......................................................................................................................................... 8 5.5.2 Voltage probe ........................................................................................................................................ 9 5.5.3 Waveform acquisition equipment ....................................................................................................... 9 5.6 Test pulse generator for immunity testing ......................................................................................... 9 5.6.1 Test pulse 1 ......................................................................................................................................... 10 5.6.2 Test pulses 2a and 2b......................................................................................................................... 11 5.6.3 Test pulses 3a and 3b......................................................................................................................... 13 5.6.4 Test pulse 4 ......................................................................................................................................... 15 5.6.5 Test pulses 5a and 5b......................................................................................................................... 16 Annex A (normative) Failure mode severity classification .......................................................................... 18 Annex B (informative) General technique for improving device electromagnetic compatibility ............. 22 Annex C (normative) Transient emissions evaluation — Voltage waveform............................................. 23 Annex D (normative) Test pulse generator verification procedure............................................................. 26 Annex E (informative) Determination of pulse generator’s energy capability ........................................... 29 Annex F (informative) Origin of transients in road vehicle electrical systems .......................................... 33 Licensed to ADVANCE DATA TECHNOLOGY CORP./EDWARD CHIUEH ISO Store order #: 662289/Downloaded: 2005-04-06 Single user licence only, copying and networking prohibited ISO 7637-2:2004(E) iv © ISO 2004 – All rights reserved Foreword ISO (the International Organization for Standardization) is a worldwide federation of national standards bodies (ISO member bodies). The work of preparing International Standards is normally carried out through ISO technical committees. Each member body interested in a subject for which a technical committee has been established has the right to be represented on that committee. International organizations, governmental and non-governmental, in liaison with ISO, also take part in the work. ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of electrotechnical standardization. International Standards are drafted in accordance with the rules given in the ISO/IEC Directives, Part 2. The main task of technical committees is to prepare International Standards. Draft International Standards adopted by the technical committees are circulated to the member bodies for voting. Publication as an International Standard requires approval by at least 75 % of the member bodies casting a vote. Attention is drawn to the possibility that some of the elements of this document may be the subject of patent rights. ISO shall not be held responsible for identifying any or all such patent rights. ISO 7637-2 was prepared by Technical Committee ISO/TC 22, Road vehicles, Subcommittee SC 3, Electrical and electronic equipment. This second edition of ISO 7637-2 cancels and replaces ISO 7637-1:1990 and ISO 7637-2:1990, of which it constitutes a technical revision. Note that ISO 7637-1:2002 cancelled and replaced ISO 7637-0:1990. ISO 7637 consists of the following parts, under the general title Road vehicles — Electrical disturbances from conduction and coupling:  Part 1: Definitions and general considerations  Part 2: Electrical transient conduction along supply lines only  Part 3: Vehicles with nominal 12 V or 24 V supply voltage — Electrical transient transmission by capacitive and inductive coupling via lines other than supply lines This corrected version of ISO 7637-2:2004 incorporates the following corrections.  In Table 4, the value for the parameter tr has been corrected from “( )00,510 − µs” to “( )00,51− µs”.  Some typographical corrections have been made. Licensed to ADVANCE DATA TECHNOLOGY CORP./EDWARD CHIUEH ISO Store order #: 662289/Downloaded: 2005-04-06 Single user licence only, copying and networking prohibited INTERNATIONAL STANDARD ISO 7637-2:2004(E) © ISO 2004 – All rights reserved 1 Road vehicles — Electrical disturbances from conduction and coupling — Part 2: Electrical transient conduction along supply lines only 1 Scope This part of ISO 7637 specifies bench tests for testing the compatibility to conducted electrical transients of equipment installed on passenger cars and light commercial vehicles fitted with a 12 V electrical system or commercial vehicles fitted with a 24 V electrical system — for both injection and the measurement of transients. Failure mode severity classification for immunity to transients is also given. It is applicable to these types of road vehicle, independent of the propulsion system (e.g. spark ignition or diesel engine, or electric motor). 2 Normative references The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. ISO 7637-1:2002, Road vehicles — Electrical disturbances from conduction and coupling — Part 1: Definitions and general considerations ISO 8854:1988, Road vehicles — Alternators with regulators — Test methods and general requirements 3 Terms and definitions For the purposes of this document, the terms and definitions given in ISO 7637-1 apply. 4 Test procedure 4.1 General These tests for measuring the transient emission on supply lines and the immunity of devices against such transients are called “bench tests”, made in the laboratory. The methods, some of which require the use of the artificial network, will provide comparable results between laboratories. They will also give the basis for the development of devices and systems, and may be used during the production phase (see Annex B). A bench test method for the evaluation of the immunity of a device against supply line transients may be performed by means of a test pulse generator; this may not cover all types of transients which can occur in a vehicle. Therefore, the test pulses described in 5.6 are characteristic of typical pulses. Licensed to ADVANCE DATA TECHNOLOGY CORP./EDWARD CHIUEH ISO Store order #: 662289/Downloaded: 2005-04-06 Single user licence only, copying and networking prohibited ISO 7637-2:2004(E) 2 © ISO 2004 – All rights reserved In special cases, it could be necessary to apply additional test pulses. However, some pulses may be omitted if a device, depending on its function or its connection, is not influenced by comparable transients in the vehicle. It is the vehicle manufacturer's responsibility to define the test pulses required for a specific device. Unless otherwise specified, a tolerance of ±10 % applies to all variables used. 4.2 Test temperature and test voltage The ambient temperature during the test shall be (23 ± 5) °C. The test voltages shall be according to Table 1 unless other values are agreed upon by the users of this part of ISO 7637, in which case such values shall be documented in test reports. Table 1 — Test voltages Test voltage 12 V system V 24 V system V UA 13,5 ± 0,5 27 ± 1 UB 12 ± 0,2 24 ± 0,4 4.3 Voltage transient emissions test This subclause specifies a test procedure for evaluating the automotive electrical and electronic components of the device under test (DUT), considered a potential source of conducted disturbances, for conducted emissions of transients along the battery-fed or switched supply lines. Care shall be taken to ensure that the surrounding electromagnetic environment does not interfere with the measurement set-up. Voltage transients from the disturbance source, the DUT, are measured using the artificial network to standardize the impedance loading on the DUT (see 5.1). The disturbance source is connected via the artificial network to the shunt resistor, Rs (see 5.2), the switch, S (see 5.3), and the power supply (see 5.4), as shown in Figure 1 a) or b). All wiring connections between artificial network, switch, and the DUT shall be spaced ( )10050 + mm above the metal ground plane. The cable sizes shall be chosen in accordance with the real situation in the vehicle, i.e. the wiring shall be capable of handling the operating current of the DUT, and as agreed between vehicle manufacturer and supplier. If no requirements are specified in the test plan, then the DUT shall be placed on a non-conductive material ( )10050 + mm above the ground plane. The disturbance voltage shall be measured as close to the DUT terminals as possible [see Figure 1 a) or b], using a voltage probe (see 5.5.2) and an oscilloscope (see 5.5.1) or waveform acquisition equipment (see 5.5.3). Repetitive transients shall be measured with the switch S closed. If the transient is caused by a supply disconnection, measurement shall be started at the moment of opening switch S. For evaluation and values, see Annex C. Licensed to ADVANCE DATA TECHNOLOGY CORP./EDWARD CHIUEH ISO Store order #: 662289/Downloaded: 2005-04-06 Single user licence only, copying and networking prohibited ISO 7637-2:2004(E) © ISO 2004 – All rights reserved 3 Dimensions in millimetres Drawing not to scale a) Slow pulses (millisecond range or slower) b) Fast pulses (nanosecond-to-microsecond range) Key 1 oscilloscope or equivalent 5 ground plane 2 voltage probe 6 power supply 3 artificial network 7 Ground connection; length < 100 mm 4 DUT (source of transient) NOTE For A, B, P, see Figure 3. Figure 1 — Transient emission test set-up Licensed to ADVANCE DATA TECHNOLOGY CORP./EDWARD CHIUEH ISO Store order #: 662289/Downloaded: 2005-04-06 Single user licence only, copying and networking prohibited ISO 7637-2:2004(E) 4 © ISO 2004 – All rights reserved DUT operating conditions of particular interest in the measurements are the turn on, the turn off, and the exercising of the various operating modes of the DUT. The exact operating conditions of the DUT shall be specified in the test plan. The sampling rate and trigger level shall be selected to capture a waveform displaying the complete duration of the transient, with sufficient resolution to display the highest positive and negative portions of the transient. Utilising the proper sampling rate and trigger level, the voltage amplitude shall be recorded by actuating the DUT according to the test plan. Other transient parameters, such as rise time, fall time and transient duration, may also be recorded. Unless otherwise specified, ten waveform acquisitions are required. Only those waveforms with the highest positive and negative amplitude (with their associated parameters) shall be recorded. The measured transient shall be evaluated according to Annex C. All pertinent information and test results shall be reported. If required per the test plan, include transient evaluation results with respect to the performance objective as specified in the test plan. 4.4 Transient immunity test The test set-up for transient immunity measurements of electrical/ electronic devices shall be as shown in Figure 2. For test pulses 3a and 3b, the leads between the terminals of the test pulse generator and the DUT shall be laid out in a straight parallel line at a height of ( )10050 + mm above the ground plane and shall have a length of (0,5 ± 0,1) m. The test pulse generator (see 5.6) is set up to provide the specific pulse polarity, amplitude, duration and resistance with the DUT and optional resistance Rv disconnected [see Figure 2 a)]. The appropriate values are selected from Annex A. Next, the DUT is connected to the generator [see Figure 2 b)], while the oscilloscope is disconnected. Depending on the real conditions, the function of the DUT may be evaluated during and/or after the application of the test pulses. For correct generation of the required test pulses, it may be necessary to switch the power supply on and off. The switching can be performed by the test pulse generator if the power supply is integral to it. One way to simulate the waveform of an alternator with centralized load dump suppression (see Figure 12), is to connect a suppression diode (or diode bridge) across the output terminals of the test pulse generator [see Figure 2 a) and b]. Since a single diode will generally have part-to-part variation and may not be able to handle the large alternator currents, the use of a bridge arrangement [an example is shown in Figure 2 c)] is recommended. The same generator shall be used for test pulses 5a and 5b. The suppression diodes and the suppressed voltage levels (clamping voltage) used by different car manufacturers are not standard. The supplier (parts manufacturers) must, therefore, obtain the diode and clamping voltage specification information from the manufacturer to be able to perform this test. The single diodes are added to the diode bridge as needed to provide the specified clamping voltage. Licensed to ADVANCE DATA TECHNOLOGY CORP./EDWARD CHIUEH ISO Store order #: 662289/Downloaded: 2005-04-06 Single user licence only, copying and networking prohibited Administrator 高亮 ISO 7637-2:2004(E) © ISO 2004 – All rights reserved 5 a) Pulse adjustment b) Pulse injection c) Example of suppression diode bridge for test pulse 5b only Key 1 oscilloscope or equivalent 5 ground plane 2 voltage probe 6 Ground connection (maximum length for test pulse 3 test pulse generator with internal power supply 3: 100 mm) resistance Ri 7 optional resistor (Rv) a 4 DUT 8 optional diode bridge b a For simulation of vehicle system loading for load dump test pulses 5a and 5b only. If used, the value of Rv shall be specified in the test plan (typical value 0,7 Ω to 40 Ω). b For simulation of load dump waveform for alternator with centralized load dump suppression for pulse 5b only [see Figure 2 c)]. c Add forward biased diodes as required to achieve max. open-circuit (suppressed) voltage. Figure 2 — Transient immunity test set-up Licensed to ADVANCE DATA TECHNOLOGY CORP./EDWARD CHIUEH ISO Store order #: 662289/Downloaded: 2005-04-06 Single user licence only, copying and networking prohibited ISO 7637-2:2004(E) 6 © ISO 2004 – All rights reserved 5 Test instrument description and specifications 5.1 Artificial