机构名称：湖南航天管理局计量检测中心

机构名称：湖南航天管理局计量中心 ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 机构名称:湖南航天管理局计量检测中心 注册号:L2874 2012年06月01日前能力范围:点击进入 地 址: A:湖南省长沙市岳麓区枫林三路217号 获准认可能力索引 序号 地址 能力范围 评审类型 更新时间 1 授权签字人(中文) 监督 2013年06月04日 A 2 授权签字人(英文) 监督 2013年06月04日 3 检测能力(中文) 监督 2013年06月04日 A 4 检测能力(英文) 监督 2013年06月04日 5 校准能力(中文) 监督 2013年06月04日 A 6 校准能力(英文) 监督 2013年06月04日 No. CNAS L2874 第 1 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Name:Metrology & Measurement Center of Hunan Spaceflight Management Bureau Registration No.:L2874 ADDRESS: A: No.217, Fenglin Sanlu, Yuelu District, Changsha, Hunan, China INDEX OF ACCREDITED SIGNATORIES No. Address Range Type Update date 1 Approved signatories (Chinese) Surveillance 2013-06-04 A 2 Approved signatories (English) Surveillance 2013-06-04 3 Testing ability(Chinese) Surveillance 2013-06-04 A 4 Testing ability(English) Surveillance 2013-06-04 5 Calibration ability (Chinese) Surveillance 2013-06-04 A 6 Calibration ability (English) Surveillance 2013-06-04 No. CNAS L2874 第 2 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 中国合格评定国家认可委员会 认 可 证 书 附 件 (注册号:CNAS L2874) 名称: 湖南航天管理局计量检测中心 地址:湖南省长沙市岳麓区枫林三路217号 签发日期:2012年03月27日 有效期至:2015年03月26日 更新日期:2012年03月27日 附件1 认可的授权签字人及领域 序号 姓 名 授权签字领域 备 注 1 胡兴 全部检测校准项目 元器件筛选检测项目、无线电电子学、电磁2 吴平 学、热学、时间频率校准项目 3 王杰 电气设备环境试验检测项目 4 张军生 几何量、热学校准项目 No. CNAS L2874 第 3 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 CHINA NATIONAL ACCREDITATION SERVICE FOR CONFORMITY ASSESSMENT APPENDIX OF ACCREDITATION CERTIFICATE (Registration No. CNAS L2874) NAME:Metrology & Measurement Center of Hunan Spaceflight Management Bureau ADDRESS:No.217, Fenglin Sanlu, Yuelu District, Changsha, Hunan, China Date of Issue:2012-03-27 Date of Expiry:2015-03-26 Date of Update:2012-03-27 APPENDIX 1 ACCREDITED SIGNATORIES AND SCOPE ? Name Authorized Scope of Signature Note 1 HuXing Calibration of all test items recognized Screening test approved project components, 2 WuPing radio electronics, electromagnetics, thermal, time and frequency calibration items Approved electrical equipment 3 WangJie environmental test items Recognition of geometric, thermal 4 ZhangJunsheng quasi-school project No. CNAS L2874 第 4 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 中国合格评定国家认可委员会 认 可 证 书 附 件 (注册号:CNAS L2874) 名称: 湖南航天管理局计量检测中心 地址:湖南省长沙市岳麓区枫林三路217号 认可依据:ISO/IEC 17025:2005以及CNAS特定认可要求 签发日期:2012年03月27日 有效期至:2015年03月26日 更新日期:2012年03月27日 附件2 认可的检测能力范围 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 军用设备环境试验方法 低 温试验 GJB150.4-1986 (只在特定情况下使用) 军用装备实验室环境试验方只测: 电气设备环0431.0 法 低温试验 1 1 低温试验 温度:? 境试验 1 GJB150.4A-2009 -80? 电工电子产品环境试验 第2 部分:试验方法 试验A:低温 GB/T2423.1-2008 No. CNAS L2874 第 5 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 军用设备环境试验方法 高 温试验 GJB150.3-1986 (只在特定情况下使用) 只测: 军用装备实验室环境试验方0431.0 2 高温试验 温度:? 法 高温试验 2 ，200? GJB150.3A-2009 电工电子产品环境试验 第2 部分:试验方法 试验B:高温 GB/T2423.2-2008 军用设备环境试验方法 湿 热试验 电气设备环 GJB150.9-1986 1 境试验 (只在特定情况下使用) 只测: 温度: 10?,军用装备实验室环境试验方 0431.0，130? 法 湿热试验 3 湿热试验 3 相对湿 GJB150.9A-2009 电工电子产品环境试验 度: 第2 部分:试验方法 30%, 试验Cab:恒定湿热试验 98% GB/T2423.3-2006 电工电子产品环境试验 第2 部分:试验方法 试验Db:交变湿热(12h+12h 循环) GB/T2423.4-2008 No. CNAS L2874 第 6 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 不用: GB/T242 3.5-199 5附录B 脉冲波 形的冲 击响应 谱和其 他试验 只用: 军用设备环境试验方法 冲 GJB150.击试验 18A 程GJB150.18-1986 电气设备环0431.0 1 4 冲击试验 序?功(只在特定情况下使用) 境试验 4 能性冲 击、程序 ? 需要 包装的 装备、程 序? 易 损性、程 序? 运 输试验。 最大加 速度:? 军用装备实验室环境试验方70g 法 冲击试验 GJB150.18A-2009 No. CNAS L2874 第 7 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 电工电子产品环境试验 第2 部分:试验方法 试验Ea和导则:冲击 GB/T2423.5-1995 只用: GJB150. 16A-200 9程序? 一般振 动、程序 ?大型 军用设备环境试验方法 振组件运 动试验 输、程序 GJB150.16-1986 电气设备环0431.0?组合 1 5 振动试验 (只在特定情况下使用) 境试验 5 式飞机 外挂的 挂飞和 自由飞。 最大加 速度: 70g 频率: (2, 2000)Hz 军用装备实验室环境试验方 法 振动试验 GJB150.16A-2009 No. CNAS L2874 第 8 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 电工电子产品环境试验 第2部分: 试验方法 试验Fc和导则:振动(正弦) GB/T2423.10-2008 只用: GJB150. 16A-200 9程序? 一般振 动、程序 ?大型 组件运电工电子产品环境试验 输、程序第2部分:试验方法 0431.0?组合5 振动试验 试验Fh :宽频带随机振动 5 式飞机(数字控制)和导则 电气设备环外挂的GB/T2423.56-2006 1 境试验 挂飞和 自由飞。 最大加 速度: 70g 频率: (2, 2000)Hz 军用设备环境试验方法 0431.1温度冲击试验 6 温度改变 1 GJB150.5-1986 (只在特定情况下使用) No. CNAS L2874 第 9 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 不用: GB/T242 军用装备实验室环境试验方 3.22-20 法 02试验 温度冲击试验 Nc两液 GJB150.5A-2009 0431.1 6 温度改变 槽法温 1 度快速 变化。 只测: 温度: (-80,电工电子产品环境试验 电气设备环180)? 第2 部分:试验方法 1 境试验 试验N:温度变化 GB/T2423.22-2002 只测: 军用装备实验室环境试验方 温度:常 法 盐雾试验 温,， GJB150.11A-2009 0431.055? 7 盐雾试验 9 沉降量: (1, 2)ml/80电工电子产品环境试验 2cm?h 第2 部分:试验方法 试验Ka:盐雾 GB/T2423.17-2008 No. CNAS L2874 第 10 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 军用装备实验室环境试验方 法 加速度试验 GJB150.15A-2009 只测: 0431.0加速度: 8 加速度试验 6 3g, 250g 电工电子产品环境试验 第2 部分:试验方法 试验Ga和导则:稳态加速度 B/T2423.15-2008 电气设备环 1 不用: 境试验 GJB150. 2A 程序 ?:快速 减压、程 序?:爆军用装备实验室环境试验方 炸减压。 温度,高度0431.1法 9 只测: 试验 6 低气压(高度)试验 温度:GJB150.2A-2009 (-70, 150)? 压力: 40pa, 常压 No. CNAS L2874 第 11 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 电工电子产品环境试验 第 2 部分:试验方法 不用: 试验Z/AM:低温/低气压 GJB150.综合试验 2A 程序GB/T2423.25-2008 ?:快速 减压、程 序?:爆 炸减压。 电气设备环温度,高度0431.1 1 9 只测: 境试验 试验 6 温度: (-70, 150)? 压力: 40pa, 电工电子产品环境试验 常压 第2 部分:试验方法 试验Z/BM:高温/低气压 综合试验 GB/T2423.26-2008 No. CNAS L2874 第 12 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 不用: BG/T242 3.38-20 08 试验 Rc:浸水 军用装备实验室环境试验方试验。 法 只测: 淋雨试验 风速:? GJB150.8A-2009 电气设备环0431.118m/s 1 10 淋雨试验 境试验 2 降雨强 度: (10, 15)cm/h 雨滴直 径: (0.5, 4.5)mm 电工电子产品环境试验 第2 部分:试验方法 试验R:水试验方法和导则 GB/T2423.38-2008 只测: 金属材料拉伸试验 Rm、A、Z、0301.0 1 拉伸试验 第1部分:室温试验方法 ReL、ReH 1 GB/T228.1-2010 F?100k金属和金属 2 N 制品 金属材料洛氏硬度试验第1 洛氏硬度试0301.0部分:试验方法(A、B、C、D、只测: 2 验 5 E、F、G、H、K、N、T标尺)HRC GB/T230.1-2009 No. CNAS L2874 第 13 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测: GB/T130 12-2008 第3条 环样法 测定磁 软磁材料直流磁性能测量方性能 直流磁性参 3 软磁材料 1 405.02 法 直流电数测量 GB/T13012-2008 压:0, 10A 磁通量: 1.05?1 -8,0 1.05?1 -60韦 产品几何技术规范(GPS)形不测面1 表面形状 0357 状和位置公差检测规定轮廓度 GB1958-2004 产品几何技术规范(GPS)形2 表面位置 0357 状和位置公差检测规定 GB1958-2004 只测:产品几何技术规范(GPS)几4 机械零件 1200mm何公差、形状、方向、位置 3 外形尺寸 0357 ?1000m和跳动公差标注 m?700mGB/T1182-2008 m以下 产品几何技术规范(GPS)表4 表面粗糙度 0357 只测:Ra 面结构轮廓 评定表面结构 的和方法GB10610-2009 No. CNAS L2874 第 14 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测: 0418.0GB/T5729-2003 5 固定电阻器 1 电阻值 (0,2) 1 第一部分:总规范 MΩ 外观和尺寸 1 检查 只测: GB/T2693-2001 2 绝缘电阻 0418.0容值? 6 固定电容器 电子设备用固定电容器 3 耐电压 2 1F，频率 第一部分:总规范 ?2MHz 4 电容量 损耗角正切5 和等效电阻 6 漏电流 1 外观检查 尺寸的测量2 GB/T8554-1998 只测:频和检验 0418.0 7 固定电感器 电子和通信设备用变压器和率?绕阻直流电8 3 电感器测量方法及试验程序 2MHz 阻 4 绝缘电阻 5 品质因数 6 有效电感 外观(包括 1 尺寸、质量) 2 互换性 3 接触电阻 低频电连接0418.0QJ1903-1990 8 器 5 电连接器总规范 外壳间的电4 连续性 5 绝缘电阻 6 耐压 No. CNAS L2874 第 15 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 GJB65B-2000 0418.0 9 电磁继电器 1 设计和结构 有可靠性指标的电磁继电器 7 总规范 2 绝缘电阻 GJB65B-2000 3 介质耐压 0418.0 9 电磁继电器 有可靠性指标的电磁继电器 4 电性能 7 总规范 5 标志 6 加工质量 7 玻璃绝缘子 1 绝缘电阻 2 介质耐电压 0423.0GJB809A-1997 10 微动开关 3 接触电阻 3 微动开关通用规范 4 标记 5 制造质量 1 外观 2 尺寸 密封钮子开0423.0GJB735-1989 11 3 接触电阻 关 3 密封钮子开关总规范 4 绝缘电阻 5 介质耐压 只测: 绝缘电 安装线缆0424.0GB/T3048-2007 电线电缆电阻?12 1 导体电阻 (非高频) 1 性能试验方法 5000MΩ 交流电 压?No. CNAS L2874 第 16 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 0424.02500V 2 绝缘电阻 2 交流电压试0424.0 3 验 5 1 绝缘电阻 只做:频 石英晶体谐0418.0GJB2138-1994 2 频率 13 率?振器 8 石英晶体元件总规范 3 密封 30MHz 4 标志 5 加工质量 只做:频1 密封 石英晶体振0418.0GJB1648-1993 14 率?荡器 8 晶体振荡器总规范 500MHz 2 频率 反向电流 1 只测:正 IR 向电压 GB/T6571-1995 (-10, 0418.0半导体器件分立器件第3部 15 二极管 ，10)V; 3 分:信号(包括开关)和调 反向电正向电压2 整二极管 VF 压 ?1500V 工作电压 3 VZ 微分电阻 4 rZ 电流传输比0418.0GB/T15651-1995 16 光电耦合器 1 hF(ctr) 3 半导体器件分立器件和集成 No. CNAS L2874 第 17 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 集电极-发电路第5部分:光电子器件 射极饱和电 2 压 Vce(sat) 集电极-基 1 极截止电流 ICBO 只测:饱 和电压0418.0 (-10,3 集电极-发 ，10)V;2 射极截止电GB/T4587-1994 反向电流ICEO 17 晶体管 半导体分立器件和集成电路 压发射极-基 第7部分:双极型晶体管 3 ?1500V极截止电流 ;电流IEBO 集电极-发(-4, 射极击穿电，4)A 4 压V(BR) CEO 集电极-基 5 极击穿电压 0418.0V(BR)CBO 3 发射极-基 6 极击穿电压 V(BR)EBO No. CNAS L2874 第 18 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 集电极-发 7 射极饱和电 压VCEsat 基极-发射 8 极饱和电压 VBEsat 只测:饱 和电压 (-10, ，10)V;GB/T4587-1994 放大倍数0418.0反向电17 晶体管 9 半导体分立器件和集成电路 hFE 3 压第7部分:双极型晶体管 ?1500V ;电流 (-4, ，4)A 栅极截止电0418.0 只测:电1 流IGSS 3 压:? GB/T4586-1994 场效应晶体1500V; 18 半导体器件分立器件 第9部 管 电流 分:场效应晶体管 漏极截止电(-40,2 流IDSS ，40)A 0418.0 栅-源阈值4 3 电压 VGS(th) 半导体集成输入失调电0418.0SJ/T10738-1996 19 1 电路运算放压VIO 7 半导体集成电路运算(电压) No. CNAS L2874 第 19 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 大器 输入失调电放大器测试方法的基本原理 2 流IIO 输入偏置电 半导体集成3 SJ/T10738-1996 流IIb 0418.0 19 电路运算放半导体集成电路运算(电压) 7 大器 静态功耗放大器测试方法的基本原理 4 PD 开环电压增 5 益AVD 半导体集成SJ/T10738-1996 0418.0 19 电路运算放共模抑制比半导体集成电路运算(电压) 6 7 KCMR 大器 放大器测试方法的基本原理 电源电压抑7 制比KSVR 输出电压 1 VO 只测:电 压 (-50,三端稳压电GB/T4377-1996 0418.0，50)V; 20 源(电压调半导体集成电路电压调整器 7 电流电压调整率整器) 测试方法的基本原理 2 (-0.1SV ,，电流调整率3 0.1)A SI 纹波抑制比4 SIip 基准电压 5 VREF No. CNAS L2874 第 20 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 输入失调电 1 压VIO 半导体集成GB/T6798-1996 0418.0 21 电路电压比输入失调电半导体集成电路电压比较器 2 7 较器 流IIO 测试方法的基本原理 输入偏置电 3 流IIb 静态功耗 4 PD 半导体集成GB/T6798-1996 0418.0 21 电路电压比开环电压增半导体集成电路电压比较器 5 7 益AVD 较器 测试方法的基本原理 输出低电平6 电压VOL 输入钳位电 1 压VIK 输出高电平2 电压VOH 输出低电平 3 电压VOL 半导体集成SJ/T10735-1996 0418.0 22 电路TTL电输入电流半导体集成电路TTL电路测 4 7 II 路 试方法的基本原理 输入高电平5 电流IIH 输入低电平6 电流IIL 输出短路电 7 流IOS No. CNAS L2874 第 21 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 输出高阻态 8 时高电平电 流IOZH 输出高阻态 9 时低电平电 流IOZL 电源电流10 ICC 输出高电平 11 电源电流半导体集成SJ/T10735-1996 0418.0ICCH 22 电路TTL电半导体集成电路TTL电路测 7 输出低电平路 试方法的基本原理 12 电源电流 ICCL 输入高电平 1 电压VIH 输入低电平 2 电压VIL 输出高电平 3 电压VOH 输出低电平半导体集成SJ/T10741-2000 4 0418.0 电压VOL 23 电路CMOS半导体集成电路CMOS电路测 7 电路 试方法的基本原理 输入高电平5 电流IIH 输入低电平 6 电流IIL 输出高电平7 电流IOH 输出低电平8 电流IOL No. CNAS L2874 第 22 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 输出高阻态 9 时高电平电 流IOZH 半导体集成SJ/T10741-2000 0418.0输出高阻态 23 电路CMOS半导体集成电路CMOS电路测 10 7 时低电平电 电路 试方法的基本原理 流IOZL 电源电流11 IDD 输出电压 1 VO 只测: 输入电 压: 0, SJ20646-1997 ?40V, 0418.0输出电流24 DC/DC模块 混合集成电路DC/DC变换器输入电2 7 IO 测试方法 流0, 输出纹波电?10A 3 压Vrip 负载: 电压调整率0,4 SV ?10A 电流调整率5 SI 6 交叉调整率 输入电流 7 II 8 效率η No. CNAS L2874 第 23 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测:体 积:? 60cm?6集成电路筛0418.0微电子器件试验方法和程序 0cm?60 25 1 外观目检 选 7 GJB548B-2005 cm;温度 范围: -55?, 125? 只测:体 积:? 60cm?6 0cm?60 2 温度循环 cm;温度 范围: -55?, 125? 集成电路筛0418.0微电子器件试验方法和程序 25 选 7 GJB548B-2005 只做:温 度范围: 3 低温测试 -55?, 125? No. CNAS L2874 第 24 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 4 高温测试 No. CNAS L2874 第 25 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只做:老 炼温 度:?12 5?;频 率 ?1MHz， 管脚 ?48DIP的54/74系列数 字芯片、 LM199/299/399、 F007/FOP07/F741、 LM124、 LM158/258/358、 F353/136模拟芯集成电路筛0418.0微电子器件试验方法和程序 25 5 老炼 片;137选 7 GJB548B-2005 系列、78 系列、79 系列、 117系列 三端稳 压器; JMD03/2 4S15、 JMD10 28S05、 JMD 24D15-2 5、 HHW28D/S、 HHF28D/S、 HSA28S系列 DC/DC模 块 No. CNAS L2874 第 26 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只做:条密封-细检 6 件A1、漏 集成电路筛0418.0微电子器件试验方法和程序 A2 25 选 7 GJB548B-2005 只做:条密封-粗检 7 件C1、漏 C2 1 外观检查 只做:体 积:? 60cm?6 0cm?60 2 温度循环 cm;温度 范围: -55?,半导体分立0418.0半导体分立器件试验方法 125? 26 器件筛选 7 GJB128A-97 只测:温 3 高温测试 度范围: -55?, 125? 4 低温测试 只测:功 率老炼: 5 老炼 (0, 150)W No. CNAS L2874 第 27 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测:反 偏电压: (0, 6 高温反偏 1000)V; 老炼温 度: ?125? 半导体分立0418.0半导体分立器件试验方法 26 密封-粗检只做:条器件筛选 7 GJB128A-97 7 漏 件C 只测:条 密封-细检 8 件H1、 漏 H2 电子设备用固定电阻器总规 1 外观检查 范 GB/T5729-2003 只测:体 积:? 0418.060cm?6 27 电阻器筛选 1 电子及电气元件试验方法 0cm?60 2 温度循环 GJB360B-2009 cm;温度 范围: -55?, 125? 电子设备用固定电容器总规0418.0 28 电容器筛选 1 外观检查 范 2 GB/T2693-2001 No. CNAS L2874 第 28 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测:体 积:? 60cm?6 0cm?60 2 温度循环 cm;温度 范围: 0418.0电子及电气元件试验方法 -55?,28 电容器筛选 2 GJB360B-2009 125? 只测:电 压:(0, 3 高温老炼 600)V; 温度: ?125? No. CNAS L2874 第 29 页 共 148 页 The scope of the accreditation in Chinese remains the definitive version. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 CHINA NATIONAL ACCREDITATION SERVICE FOR CONFORMITY ASSESSMENT APPENDIX OF ACCREDITATION CERTIFICATE (Registration No. CNAS L2874) NAME:Metrology & Measurement Center of Hunan Spaceflight Management Bureau ADDRESS:No.217, Fenglin Sanlu, Yuelu District, Changsha, Hunan, China Accreditation Criteria:ISO/IEC 17025:2005 and relevant requirements of CNAS Date of Issue:2012-03-27 Date of Expiry:2015-03-26 Date of Update:2012-03-27 APPENDIX 2 ACCREDITED TESTING Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Environmental test methods for military equipments Low temperature test GJB150.4-1986 Attention: Only use Accredited Low Electric equipment in special condtion only for: 1 1 temperature 0431.01 environment Test Laboratory Test temp?-80? environmental test methods for military materiel Low temperature test GJB150.4A-2009 No. CNAS L2874 第 30 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Environmental testing for electric Accredited Low and electronic only for: 1 temperature 0431.01 products-Part2:Test Test methods-Tests temp?-80? A:Cold GB/T2423.1-2008 Environmental test methods for military equipments High temperature testl GJB150.3-1986 Accredited Attention: Only use only for: Electric equipment in special condtion 1 environment Test temp:?，Laboratory environmental test 200? High methods for military 2 temperature 0431.02 materiel Test High temperature test GJB150.3A-2009 Environmental testing for electric Accredited and electronic only for: products-Part2:Test temp:?，methods-Tests 200? B:Dry heat GB/T2423.2-2008 No. CNAS L2874 第 31 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Environmental test methods for military equipments Damp heat test GJB150.9-1986Atte ntion: Only use in special condtion Laboratory environmental test methods for military Accredited materiel only for: Damp heat test temp: GJB150.9A-2009 10?,，Electric equipment wet & hot Environmental 1 3 0431.03 environment Test Test 130? testing for electric relative and electronic humidity: products-Part2:Testi 30%,98% ng method-Test Cab:Dampheat,stead y state GB/T2423.3-2006 Environmental testing for electric and electronic products-Part2:Test method-Test Db:Dampheat,cyclic (12h+12h circle) GB/T2423.4-2008 No. CNAS L2874 第 32 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Except for: GB/T2423.5- 1995's appendix B :impulse wave's impact respond chart and another Accredited only for: GJB150.18A Environmental test PROCESS?methods for military FUNCTIONequipments Electric equipment ALITY 1 4 Impact Test 0431.04 Shock test environment Test IMPACT、GJB150.18-1986 process Attention: Only use ?,the in special condtion epuipment need to be put up, process ? easily harm, process ? traffic test。 Max acceleration: ?70g No. CNAS L2874 第 33 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Laboratory environmental test methods for military materiel Shock test GJB150.18A-2009 No. CNAS L2874 第 34 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Except for: GB/T2423.5- 1995's appendix B :impulse wave's impact respond chart and another Accredited only for: GJB150.18A Environmental PROCESS?testing for electric FUNCTIONand electronic Electric equipment ALITY 1 4 Impact Test 0431.04 products-Part2:Test environment Test IMPACT、methods-Test Ea and process guidance:Shock ?,the GB/T2423.5-1995 epuipment need to be put up, process ? easily harm, process ? traffic test。 Max acceleration: ?70g No. CNAS L2874 第 35 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited only for: GJB150.16A- 2009 processEnvironmental test ?:currently methods for military vibration,procequipments ess ?:large Vibration test module GJB150.16-1986 transit、Attention: Only use Electric equipment Vibration in special condtion 1 5 0431.05 processenvironment Test Test ?:assembled airplane's hanging fly & freedom fly。 Speed max: 70g frequency: (2,2000)Laboratory Hz environmental test methods for military materiel Vibration test GJB150.16A-2009 No. CNAS L2874 第 36 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited only for: Environmental GJB150.16A- testing for electric 2009 process and electronic ?:currently products-Part2:Tests vibration,proc methods Test Fc: ess ?:large Vibration(sinusoidalmodule ) transit、 Electric equipment Vibration GB/T2423.10-2008 1 5 0431.05 processenvironment Test Test ?:assembled airplane's hanging fly & freedom fly。 Speed max: 70g frequency:Environmental (2,2000)testing for electric Hz and electronic products-Part2:Test methods Test N:Change of temperature GB/T2423.56-2006 No. CNAS L2874 第 37 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Except for: Environmental test test nc of methods for military GB/T2423.22equipments -2002 Electric equipment Temperature Temperature shock 1 6 0431.11 Accredited environment Test alter test only for: GJB150.5-1986 Attention: Only use temp: in special condtion (-80, 180)? Laboratory environmental test methods for military Except for: materiel test nc of Temperature shock GB/T2423.22 test -2002 Electric equipment Temperature GJB150.5A-2009 1 6 0431.11 Accredited environment Test alter only for: temp: Part 2:Test method Test N:Temperature GB/T2423.22-2002 No. CNAS L2874 第 38 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Laboratory environmental test Accredited methods for military only for: materiel temp: Salt fog test ordinary GJB150.11A-2009 pressure,， 7 Salt fog Test 0431.09 55? subside Electric equipment quantity: Environmental 1 environment Test (1,testing for electric 22)ml/80cm?h and electronic products-Part2:Tests methods Test Ka: Salt mist GB/T2423.17-2008 Laboratory Accredited environmental test only for: acceleration methods for military 8 0431.06 Test acceleration: materiel- Acceleration test 3g,250g GJB150.15A-2009 Environmental testing for electric and electronic Accredited products-Part2:Tests only for: Electric equipment acceleration 1 8 0431.06 methods-Test Ga environment Test Test acceleration: and 3g,250g guidance:Accelerati on,steady B/T2423.15-2008 No. CNAS L2874 第 39 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Laboratory Except for: environmental test process methods for military I(speediness materiel- decompress) Low & II(explode pressure(altitude) decompress) test Accredited Temperature GJB150.2A-2009 only for: Electric equipment 1 9 & Height 0431.16 temp: environment Test Test (-70, 150)? pressure: Environmental 40pa, testing for electric ordinary and electronic pressure products-Part2:Tests methods-Test Z/AM:Combined cold/low air pressure tests GB/T2423.25-2008 No. CNAS L2874 第 40 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Environmental testing for electric and electronic products-Part2:Tests methods-Test Z/AM:Combined dru jeat/low air pressure tests GB/T2423.26-2008 Laboratory environmental test Electric equipment methods for military 1 10 Rainny Test 0431.12 environment Test materiel- Except for: Rain test BG/T2423.38 GJB150.8A-2009 -2008 test Rc:water test。 Accredited only for: Environmental Fan speed: testing for electric ?18m/s and electronic ranny Electric equipment products-Part2:Test 1 10 Rainny Test strenth: environment Test methods-Test (10,15)cm/h R:Water test method Raindrop and guidance dia.: GB/T2423.38-2008 (0.5,4.5)mm No. CNAS L2874 第 41 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Metallic Accredited meterials-Tensile only for: testing- Metal and Metal Tensile Rm、A、Z、Part1:Method of 2 1 0301.01 Produce testing test at Room ReL、ReH temperature F?100kN GB/T228.1-2010 Metallic meterials-Rockwell hardness test-Part Rockwell 1:Test Metal and Metal Accredited 2 2 hardness 0301.05 method(A,B,C,D,E,Produce only for:HRC test F,G,H,K,N,Tstaff guage) GB/T230.1-2009 Accredited only for: No.3 of Soft magnetism GB/T13012-2DC meterial DC 008 Soft magnetism magnetism magnetism 3 1 405.02 DC voltage:meterial parameter parameter measure 0,10A measure method GB/T13012-2008 Flux: -81.05?10, -61.05×10 Product geometry Except for:techinc standardSurface 1 Profile of any shape (GPS) for shape 4 Machine accessory 0357 piane & position measure rule Surface GB1958-2004 2 position No. CNAS L2874 第 42 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Rule And Method of GPS Tolerance, Accredited Shape, Direction, only for:?Position and Surface 3 1200mm? Flounce Tolerance Size label (Product 1000mm? Geometry Technical 700mm Criterion) 4 Machine accessory 0357 GB/T1182-2008 Rule And Method For GPS Surface Profile's Surface Surface Accredited Configurable is 4 roughness only for:Ra Assessed degree Product Geometry Technic Criterion GB10610-2009 Accredited Surface & Fixed resistors for only for:1 Size use in electronic Resistance checkup 5 Fixation resistor 0418.01 equipment-Part1:Ge ?(0~2)Mneric specification GB/T5729-2003 Resistor Ω 2 value Surface & 1 Size Fixed capacitors for Accredited checkup use in electronic only for: 6 Fixation capacitor 0418.02 equipment-Part1:Gevalue?1F，Insulated neric specification 2 freq?2MHz resistor GB/T2693-2001 Endure 3 voltage No. CNAS L2874 第 43 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter 4 Capacitance Ullage Fixed capacitors for Accredited tangent and 5 use in electronic only for:equivalent 6 Fixation capacitor 0418.02 equipment-Part1:Geresistor value?1F，neric specification freq?2MHz GB/T2693-2001 Leak 6 current Surface 1 checkup Tranformer and inductors for use in electronic and Accredited Size Fixation telecommunication 2 measure & only for: 7 0418.08 inductance equipment checkup ?2MHz Mesauring methods Coil DC 3 and test procedures resistor GB/T8554-1998 Insulated 4 resistor Quality 5 factor Availability 6 inductance Surface(incl 1 ude Electrical linkerchief Low frequency size,mass) 8 0418.05 standard electrical linker QJ1903-1990 Interconvert 2 character No. CNAS L2874 第 44 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Contact 3 resistor Crusts 4 electric continuity Electrical linkerchief Low frequency 8 Insulated 0418.05 standard electrical linker 5 resistor QJ1903-1990 Endure 6 voltage Design & 1 Structure Insulated 2 Relays resistor electromagnetic,estaMedium Electromagnetism blished 3 endure 9 0418.06 relay reliablilty ,general voltage specification for Electricity 4 GJB65B-2000 capability 5 Sign Machining 6 quality Glass 7 insulation organ Switches,sensitive ,g Insulated eneral specification 10 sensitive Switches 1 0423.03 resistor for GJB809A-1997 No. CNAS L2874 第 45 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Medium 2 endure voltage Contact 3 Switches,sensitive ,gresistor eneral specification 10 sensitive Switches 0423.03 for 4 Sign GJB809A-1997 Pruduct 5 quality 1 Surface Switches,toggle 2 Size environmentally Pressurize button 11 0423.03 sealed,general Contact switch 3 specification for resistor GJB735-1989 Insulated 4 resistor Medium 5 endure voltage Accredited only for:Test methods for Conductor Insulated 1 0424.01 Installation electrical properties resistor resistor value12 cable(within high of electric cables frequency) and wires ?5000MΩ、 GB/T3048-2007 AC voltage? 2500V Insulated 2 0424.02 resistor No. CNAS L2874 第 46 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter AC voltage 3 0424.05 Test Insulated 1 resistor Crystal units，Accredited Quartz crystal quartz， general only for:freq13 0418.08 2 Frequency syntony organ specification for ?30MHz 3 Pressurize GJB2138-1994 4 Sign Machining 5 quality Oscillators, crystal Accredited 1 Pressurize Quartz crystal general specification only for:freq14 0418.08 surge organ for ?500MHz GJB1648-1993 2 Frequency Countercurr1 ent Ir Semiconductor Accredited devices-discrete only for:VFdevices Part (-10,，3:Singal(include 15 Diode 418.03 Positive 10)V;VBRswitch)and regular 2 favor voltage VF ?1500V diode GB/T6571-1995 Work 3 voltage VZ Differential 4 coefficient resistor rZ No. CNAS L2874 第 47 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Current Semiconductor 1 transers devices Discrete ratio hF(ctr) devices and Photoelectricity integrated circuits 16 0418.03 coupling organ Part 5:Optoelectronic Collector-trdevices ansmit pole GB/T15651-1995 2 saturation voltage Vce(sat) Collector-ba sic pole 1 cut-off current Accredited ICBO Semiconductor only discrete devices and for:VoltageCollector-trintegrated circuits (-10,，17 Transistor 0418.03 ansmit pole Part 7:Bipolar 10)V;VBR2 cut-off transistors ?1500V;IOcurrent GB/T4587-1994 (-4,，4)A ICEO Collector-ba sic pole 3 cut-off current IEBO No. CNAS L2874 第 48 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited Semiconductor only Collector-trdiscrete devices and for:Voltageansmit pole integrated circuits (-10,，17 Transistor 4 strike out 0418.03 Part 7:Bipolar 10)V;VBRvoltage transistors V(BR) CEO ?1500V;IOGB/T4587-1994 (-4,，4)A Collector-ba sic pole 5 strike out voltageV(B R)CBO transmit pole-basic Accredited 6 pole strike Semiconductor only out voltage discrete devices and for:VoltageV(BR)EBO integrated circuits (-10,，17 Transistor 0418.03 Collector-trPart 7:Bipolar 10)V;VBRansmit pole transistors ?1500V;IO7 saturation GB/T4587-1994 (-4,，4)A voltage VCEsat basic pole-transm 8 it saturation voltageVBE sat Blowup 9 multiple hFE No. CNAS L2874 第 49 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Bar pole cut-off 1 current Accredited IGSS only Semiconductor unit for:Voltage:schism unit part Scene domino leak pole ?1500V;18 0418.03 8:scene domino offect transistor cut-off offect transistor Current2 current GB/T4586-1994 (-40,， IDSS 40)A Bar-fountio n threshold 3 value voltage VGS(th) Input malajustme1 General principles nt voltage of measuring VIO methods of Semiconductor IC operational(voltage) 19 0418.07 operation amplifier amplifiers for Input semioconductor malajustme2 integrated circuits nt current SJ/T10738-1996 IIO Input 3 leaning set current IIb No. CNAS L2874 第 50 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Static work 4 PD General principles of measuring Openning methods of annulus Semiconductor IC operational(voltage) 5 19 0418.07 voltage plus operation amplifier amplifiers for AVD semioconductor integrated circuits share SJ/T10738-1996 module 6 restrain ratio KCMR Power and Voltage 7 restrain ratio KSVR Accredited Semiconductor only Output integrated for:Voltage 1 voltage VO circuits General (-50,，Voltage adjust 20 0418.07 principles of 50)V;organ measuring methods Currentof voltage regulator (-0.1,，GB/T4377-1996 Voltage 0.1)A 2 adjust ratio SV No. CNAS L2874 第 51 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Current Accredited 3 adjust ratio Semiconductor only SI integrated for:Voltage circuits General (-50,，Voltage adjust 20 0418.07 principles of 50)V;organ measuring methods CurrentVeins wave of voltage regulator (-0.1,，4 restrain GB/T4377-1996 0.1)A ratio SIip Basic 5 voltage VREF Input malajustme1 nt voltage Semiconductor VIO integrated circuits General Semiconductor IC principles of Input 21 voltage compare 0418.07 measuring methods malajustmeorgan 2 of voltage nt current comparators IIO GB/T6798-1996 Input 3 leaning set current IIb Static work 4 PD No. CNAS L2874 第 52 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Openning Semiconductor annulus 5 integrated voltage plus circuits General AVD Semiconductor IC principles of 21 voltage compare 0418.07 measuring methods organ of voltage Output low comparators electricity GB/T6798-1996 6 calm voltage VOL Input grip 1 digit voltage VIK General principles Output high of measuring electricity methods of TTL 2 calm 22 Semiconductor IC 0418.07 circuits for voltage semiconductor VOH integrated circuits Output low SJ/T10735-1996 electoricity 3 calm voltage VOL Input 4 current II No. CNAS L2874 第 53 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Input high electricity 5 calm current General principles IIH of measuring methods of TTL Semiconductor 22 0418.07 circuits for Input low IC semiconductor electricity 6 integrated circuits calm current SJ/T10735-1996 IIL Output short 7 circuit current IOS Output high electricity calm current 8 in high resistor General principles value state of measuring IOZH methods of TTL Output high 22 Semiconductor IC 0418.07 circuits for electricity semiconductor calm current integrated circuits 9 in low SJ/T10735-1996 resistor value state IOZL Power 10 current ICC No. CNAS L2874 第 54 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Output high electricity 11 calm power current ICCH General principles Output low of measuring electricity methods of TTL 22 Semiconductor IC 12 calm power 0418.07 circuits for current semiconductor ICCL integrated circuits SJ/T10735-1996 Input high Semiconductor electricity 1 integrated circuits calm power General principles voltage VIH CMOS 23 0418.07 of measuring semiconductor IC methods for CMOS Input low circuits SJ/T10741-2000 electricity 2 calm power voltage VIL Semiconductor Output high integrated circuits electricity CMOS General principles 23 3 calm power 0418.07 semiconductor IC of measuring voltage methods for CMOS VOH circuits No. CNAS L2874 第 55 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Output low SJ/T10741-2000 electricity 4 calm power voltage VOL Input high electricity 5 calm power current IIH Input low electricity 6 calm power current IIL Output high Semiconductor electricity 7 integrated circuits calm power General principles current IOH CMOS 23 0418.07 of measuring semiconductor IC Output low methods for CMOS electricity circuits 8 calm power SJ/T10741-2000 current IOL Output high electricity calm current 9 in high resistor value state IOZH No. CNAS L2874 第 56 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Outputlow electricity calm current 10 in low resistor value state IOZL Power 11 current IDD Output 1 voltage VO Accredited only for: Output The measuring 2 Input:0,?current IO methods of 40V,0,?out veins DC/DC converters 24 DC/DC module 0418.07 3 wave 10A;Load 1:for hybird integrated voltage Vrip circuits 0,? Voltage SJ20646-1997 10A,Load 2: 4 adjust ratio 0,?10A SV Current 5 adjust ratio SI cross adjust 6 ratio Input 7 current II No. CNAS L2874 第 57 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter effect ratio 8 η Accredited only for: Test methods and Size:?60cmProcedures for Surface eye ?60cm?25 IC filter 1 0418.07 microelectronic checkout device 60cm;Temp GJB548B-2005 range: -55?, 125? Accredited only for: Size:?60cm ?60cm?Temperature 2 60cm;Temp circle range: -55?, Test methods and 125? Procedures for 25 IC filter 0418.07 microelectronic device GJB548B-2005 Accredited only for: Low temp range: 3 temperature text -55?, 125? No. CNAS L2874 第 58 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter High 4 temperature text No. CNAS L2874 第 59 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited only for: Aging temp: ?125?; frequency? 1MHz,pin? 48P and 54/74 series digital chip,LM199/ 299/399,F007 /FOP07/F741, LM124,LM15 Aging Test methods and 58/258/358,F Procedures for 353/136 draft 25 IC filter 0418.07 microelectronic Chip,137/7/7 device 9/117 series GJB548B-2005 manostat,JM D03/24S15,J MD10 28S05,JMD 24D15-25,H HW28D/S,H HF28D/S,HS A28S series DC/DC module. Pressurize-sAccredited lender only for:6 check up A1,A2 the leak No. CNAS L2874 第 60 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited Pressurize-g 7 ruff check only for: up the leak C1,C2 surface 1 checkup Accredited only for: Volume:? 60cm?60cmTemperature 2 circle ?60cm; Temp range: Test methods For -55?,Semiconductor semiconductor 125? 26 discrere devices 0418.07 discrere devices filter GJB128A-97 High Accredited 3 temperature only for:temp text range: -55?,Low 125? 4 temperature text Accredited only for: 5 Aging power Aging: (0,150)W No. CNAS L2874 第 61 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited only for: High Reverse temperature voltage:(0,6 Test methods For reverse Semiconductor semiconductor 1000)V;leaning 26 discrere devices 0418.07 discrere devices Aging temp filter GJB128A-97 ?125? Pressurize-gAccredited 7 ruff check only for:C up the leak Pressurize-sTest methods For Accredited Semiconductor lender semiconductor only for:26 discrere devices 8 0418.07 check up discrere devices filter H1,H2 the leak GJB128A-97 Fixed resistors for use in electronic Surface 1 equipment-Part1:Ge checkup neric specification GB/T5729-2003 Accredited only for:27 Resistor filter 0418.01 Test methods of Volume:? electronic and 60cm?60cmTemperature 2 electrical component ?60cm;circle parts Temp range:GJB360B-2009 -55?, 125? Fixed capacitors for use in electronic Surface 28 Capacitor filter 1 0418.02 equipment-Part1:Gecheckup neric specification GB/T2693-2001 No. CNAS L2874 第 62 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited only for: Test methods of Volume:? electronic and 60cm?60cmTemperature 2 electrical component ?60cm;circle parts Temp range:GJB360B-2009 -55?, 125? Accredited Test methods of only for: High electronic and Voltage:(0, 28 Capacitor filter 3 temperatute 0418.02 electrical component 600)V;aging parts Temp:?GJB360B-2009 125? No. CNAS L2874 第 63 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 中国合格评定国家认可委员会 认 可 证 书 附 件 (注册号:CNAS L2874) 名称: 湖南航天管理局计量检测中心 地址:湖南省长沙市岳麓区枫林三路217号 认可依据:ISO/IEC 17025:2005以及CNAS特定认可要求 签发日期:2012年03月27日 有效期至:2015年03月26日 更新日期:2012年03月27日 附件3 认可的校准能力范围 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) JJG315-1983《直只做0410.10mV,-6直流电压 流数字电压表检U=8.3?10 主要rel01 1000V 定规程》 校准 参量1 数字多用表 示值 误差 (0.1,的校-5U=6.5?10 JJG598-1989《直rel100)mA 准 0410.直流电流 流数字电流表检03 定规程》 (0.1,-4U=6.9?10 rel3)A No. CNAS L2874 第 64 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) JJG724-1991《直-5 0410.0.1Ω,U=1.0?10rel直流电阻 流数字电阻表检 ,-409 100MΩ 2.6?10 定规程》 JJG(航天)10mV, 0410.34-1999《交流数750V 交流电压 见下表 02 字电压表检定规(3Hz, 程》 300kHz) 交流电压 频率(Hz) 电压范围 3-55-1010-20k20k-50k50k-100k100k-300k -4-4-4-4-3-3只做(10,100)mVU=2.1?10U=2.1?10U=1.8?10U=1.5?10U=1.1?10U=1.1?10relrelrelrelrelrel 主要-4-4-4-4-4-3(0.1,1)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10relrelrelrelrelrel校准-4-4-4-4-4-3(1,10)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10参量relrelrelrelrelrel1 数字多用表 -4-4-4-4-4-3示值(10,100)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10relrelrelrelrelrel误差-4-4-4-4-3-3(100,750)VU=1.7?10U=1.7?10U=1.7?10U=3.3?10U=1.0?10U=1.0?10relrelrelrelrelrel的校 准 (0.01, -43)A U=5.8?10 rel (3-5)Hz JJG(航天) 0410.35-1999《交流数交流电流 04 字电流表检定规 程》 (0.01, 3)A -3U=1.1?10 rel(5, 10)Hz No. CNAS L2874 第 65 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) (0.01, 3)A -3U=4.9?10 rel10Hz, 5kHz 0.1mV,-3=3.0?10U rel1V 0410.直流电压 01 -5 U=7.6?10(1,rel -4,7.2?10 1000)V 0410.0.1μA,-3直流电流 U=6.7?10 rel03 5A JJG124-2005《电 流表、电压表、-2 0410.0.01Ω,U=2.1?10rel2 模拟多用表 电阻 功率表及电阻表-409 100MΩ ,6.5?10 检定规程》 0.1mV,-3U=1.5?10 rel10V 0410.(10,-4交流电压 U=4.5?10 rel02 50)V (50,-4U=2.7?10 rel500)V 0410.0.1mA,-3交流电流 U=5.5?10 rel04 5A -3 0410.0.1mV,U=2.3?10rel直流电压 JJG124-2005《电-401 1000V ,8.2?10 流表、电压表、3 电压表 功率表及电阻表 -3 检定规程》 0410.0.1mV,U=3.2?10rel交流电压 -402 1000V ,7.9?10 JJG124-2005《电 0410.流表、电压表、0.1μA,-34 电流表 直流电流 U=6.8?10 rel03 功率表及电阻表5A 检定规程》 No. CNAS L2874 第 66 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) 0410.0.1μA,-3交流电流 U=7.3?10 rel04 5A 0410.11mW,JJG124-2005《电-4直流功率 U=8.5?10 rel05 20kW 流表、电压表、5 功率表 功率表及电阻表 检定规程》 0410.110mW,-3交流功率 U=1.1?10 rel05 20kW U=1.2?rel0.1kΩ,-310, 100MΩ JJG622-1997《绝-32.6?10 不能绝缘电阻 缘电阻表检定规做的0410.程》 (0.1,-26 兆欧表 =2.3?10项目: U rel09 JJG1005-200510)GΩ 短路《电子式绝缘电电流 阻表检定规程》 (0,3)-2电压 U=1.9?10 relkV JJG445-1986《直0409.0.1mV,-6直流电压 U=7.6?10 流标准电压源检rel01 1000V 定规程》 10μA,-5U=2.1?10 多功能校准rel33mA 7 JJG(航天)源 0409.38-1987《直流标(33,-5直流电流 U=6.5?10 rel03 准电流源检定规330)mA 程》 (0.33,-4U=5.1?10 rel20)A JJG166-1993《直0.0001只做-5 0409.U=1.2?10rel直流电阻 流电阻器检定规Ω,1.1G 主要-305 ,3.5?10 程》 Ω 校准多功能校准7 参量JJG(航天)1mV,源 示值0409.2-1999《交流标1000V 交流电压 见下表 误差02 准电压源检定规(10Hz, 的校程检定规程》 500kHz) No. CNAS L2874 第 67 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) 准 交流电压 频率(Hz)电压范围10-4545-10k10k-20k20k-50k50k-100k100k-500k-4-4-4-4-4-3(1,33)mVU=3.7?10U=2.8?10U=2.8?10U=4.8?10U=6.5?10U=1.4?10relrelrelrelrelrel-4-5-5-4-4-4(33,330)mVU=1.2?10U=6.3?10U=6.3?10U=1.0?10U=2.1?10U=5.3?10relrelrelrelrelrel-5-5-5-5-4-4(0.33,3.3)V=7.7?10=2.9?10=2.9?10=5.6?10=1.9?10=3.0?10UUUUUUrelrelrelrelrelrel-4-5-5-5-4-4 (3.3,33)VU=3.8?10U=5.4?10U=5.4?10U=6.8?10U=1.1?10U=2.3?10relrelrelrelrelrel 频率(Hz)电压范围45-1k1k-10k10k-20k20k-50k50k-100k/-4-5-5-4-4(33,330)VU=2.3?10U=4.0?10U=8.0?10U=1.1?10U=2.4?10/relrelrelrelrel 频率(Hz)电压范围45-1k1k-5k5k-10k///-4-5-4(330,1000)VU=4.7?10U=4.5?10U=4.4?10///relrelrel JJG(航天)0.1mA, 0410.51-1999《交流标20A 交流电流 见下表 04 准电流源检定规(10Hz, 程》 50kHz) 交流电流频率(Hz)只做电流范围10-2020-4545-1k1k-5k5k-10k10k-30k-4-4-4-4-4-4主要(29,330)μAU=5.9?10U=5.8?10U=5.8?10U=4.7?10U=7.2?10U=8.3?10relrelrelrelrelrel-4-4-4-4-4-4(0.33,3.3)mAU=1.6?10U=1.0?10U=3.8?10U=1.2?10U=4.7?10U=7.5?10relrelrelrelrelrel校准-4-4-4-4-4-4(3.3,33)mAU=1.4?10U=1.2?10U=1.2?10U=1.2?10U=1.7?10U=4.3?10relrelrelrelrelrel-4-5-5-5-4-4(33,330)mAU=1.3?10U=9.9?10U=5.0?10U=9.6?10U=5.8?10U=4.2?10relrelrelrelrelrel多功能校准参量频率(Hz)7 电流范围源 示值10-4545-1k1k-5k5k-10k//-4-4-4-4(0.33,1.1)AU=2.4?10U=2.4?10U=2.3?10U=1.2?10//relrelrelrel误差-4-4-4-4(1.1,3)AU=2.9?10U=7.8?10U=5.9?10U=2.9?10//relrelrelrel频率(Hz)的校电流范围45-100100-1k1k-5k///-4-4-4准 (3,11)AU=5.1?10U=4.7?10U=4.7?10///relrelrel-4-4-4(11,20)AU=5.9?10U=5.8?10U=5.8?10///relrelrel 0426.500V,-2不能直流电压 U=3.1?10 rel01 10000V 做的 项目:0426.500V,-2交流电压 U=2.6?10 rel容量，02 10000V 直流JJG795-2004《耐耐电压测试0410.(0.1,电压-38 直流电流 电压测试仪检定U=1.6?10 rel仪 03 100)mA 纹波规程》 系数， 0410.(0.1,-4交流交流电流 U=8.0?10 rel04 100)mA 电压 失真0412.1s,-3持续时间 U=7.7?10 rel度 04 15min No. CNAS L2874 第 68 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) 不能 做的JJG982-2003《直-5 0402.0.01Ω,U=1.3?10项目rel9 直流电阻箱 电阻 流电阻箱检定规 -401 100MΩ ,2.6?10 工频程》 耐压 试验 (0.01,-4U=5.9?10 rel100)mV 0425.直流电压 01 -3 U=5.7?100.1V,rel -4JJG(航,8.2?10 1000V 直流稳压 天)6-1999《直流10 0425.(0,30)-3电源 稳压电压检定规直流电流 U=8.7?10 rel01 A 程》 纹波电压有0425.(0.01,-3U=2.6?10 rel效值 02 100)mV 纹波电压峰0425.(0.01,-2U=3.6?10 rel峰值 02 300)mV 0409.-2电压 1mV~20V U=1.6?10 rel01 JJG602-1996低低频信号发0412.10Hz~1MH11 频信号发生器检 -6频率 U=1.8?10 生器 rel08 z 定规程 0413.0.01%~30-2失真度 U=7?10 rel04 % JJG180-2002 0412.电子测量仪器内5MHz、 -912 频率计 频率 U=3.6?10 rel01 石英晶体振荡器10MHz 检定规程 0406.0.1mH~10-3电感 U=1.2?10 relGJB/J5412-200501 H 13 LCR测量仪 宽量程数字RLC 0404.500pF~1测量仪检定规程 -3电容 U=7.1?10 rel01 μF 0413.JJG262-1996模-214 示波器 上升时间 ,500ps U=2.1?10 rel03 拟示波器检定规 No. CNAS L2874 第 69 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) 程 扫描时间因0413.-35ns~50s U=5.1?10 rel数 03 垂直偏转系0413.-32mV~200V =6.2?10U relJJG262-1996模数 05 14 示波器 拟示波器检定规 0413.DC~1000M程 频带宽度 U=2.8 rel01 Hz 10Hz~ -3 500kHz U=1.2?10电子电压表检定rel基本刻度 -31mV~1000,7.2?10 规程 V 0409.JJG250-1990 15 电子电压表 02 宽频电子电压表 检定规程10Hz~ -3 GJB/J3411-1998 1000MHz U=3.7?10rel频率响应 -20.3V~1.5, 1.1?10 V 1514.(-80~300JJF1101-2003环温度 U=0.4? 02 )? 环境试验设境试验设备温16 备 度、湿度校准规 范 1517.30%RH~98湿度 U=1.8%RH 02 %RH (0-25)U=1.4μm mm (25-50)U=1.5μm mm (50-75)U=1.6μm mm 1303.JJG21-2008千分(75-10017 外径千分尺 长度 U=1.7μm 18 尺检定规程 )mm (100-12U=1.8μm 5)mm (125-15U=1.9μm 0)mm (150-17U=2.0μm 5)mm No. CNAS L2874 第 70 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) (175-20U=2.2μm 0)mm (200-22U=2.3μm 5)mm (225-25U=2.4μm 0)mm (250-27U=2.6μm 5)mm (275-30U=2.7μm 0)mm (300-32U=2.8μm 5)mm 1303.JJG21-2008千分17 外径千分尺 长度 18 尺检定规程 (325-35U=2.9μm 0)mm (350-37U=3.2μm 5)mm (375-40U=3.3μm 0)mm (400-42U=3.4μm 5)mm (425-45U=3.6μm 0)mm 1303.JJG21-2008千分(450-4717 外径千分尺 长度 U=3.7μm 18 尺检定规程 5)mm (475-50U=4.0μm 0)mm (0-25)U=1.2μm mm (25-50)JJG26-2001杠杆=1.6μm U 1303.mm 18 杠杆千分尺 长度 千分尺、卡规检 29 定规程 (50-75)U=1.7μm mm (75-100U=1.9μm )mm 1303.JJF1091-2002测(5-30) 19 内测千分尺 长度 U=1.2μm 29 量内尺寸千分尺mm No. CNAS L2874 第 71 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) 校准规范 (25-50) U=1.5μm mm (50-75) U=1.7μm mm (75-100U=1.8μm ) mm (100-12U=1.9μm JJF1091-2002测5) mm 1303.19 内测千分尺 长度 量内尺寸千分尺 29 (125-15校准规范 U=2.2μm 0) mm (0-25)U=1.2μm mm (25-50)JJG82-2010公法U=1.4μm 公法线类千1303.mm 20 长度 线千分尺检定规 分尺 29 程 (50-75)U=1.6μm mm (75-100U=1.7μm )mm (0-25)U =0.8μm mm (25-50)U =0.83μm mm (50-75)=0.84μm U mm (75-100U =0.87μm )mm 1303.JJG24-2003深度21 深度千分尺 长度 29 千分尺检定规程 (100-12U =0.95μm 5)mm (125-15U =0.99μm 0)mm (150-17U =1.2μm 5)mm (175-20U =1.2μm 0)mm 1303.JJG30-2002通用(0-150)22 通用卡尺 长度 U=8.2μm 23 卡尺检定规程 mm No. CNAS L2874 第 72 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) (0-200)U=8.4μm mm (0-300)U =8.6μm mm (0-500)U =9.5μm mm (0-1000U =24μm )mm (0-300)U =9.5μm mm 1303.JJG31-2011高度23 高度卡尺 长度 29 卡尺检定规程 (0-500)U =15μm mm 75mm U=0.33μm 125mm 175mm 1303.JJG63-2007刀口24 刀口形直尺 直线度 200mm 03 形直尺检定规程 U=0.50μm 225mm 300mm U=0.66μm (0-3)mm U=3.6μm 百分表 (0-5)mm (0-10)mm U=4.8μm 1303.JJG34-2008指示25 指示表 长度 (0-10)mm 15 表检定规程 U=5.7μm 千分表 U=2.2μm (0-1)mm (6-10)U=2.8μm mm 1303.JJF1102-2003内(10-18)26 内径表 长度 μ U=3.5m 15 径表校准规范 mm (18-35)U=4.8μm mm No. CNAS L2874 第 73 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) (35-50)U=5.3μm mm (50-450U=6.2μm )mm 千分表 U=1.2μm (0-0.2)m m 1303.JJG35-2008杠杠27 杠杆表 长度 15 表检定规程 百分表 U=2.8μm (0-0.8)m m 160mm?1 1303.JJG117-2005平00mm~ 28 平板 平面度 U=0.6μm 01 板检定规程 250mm?1 60mm 250mm?2 50mm~ U=0.8μm 300mm?3 00mm 400mm?2 50mm~ U=1.0μm 630mm?4 00mm 1303.JJG117-2005平28 平板 平面度 01 板检定规程 630mm?6 30mm~ U=1.2μm 800mm?5 00mm 800mm?8 00mm~ U=1.5μm 1000mm? 750mm No. CNAS L2874 第 74 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) 1000mm?U=1.8μm 1000mm 1250mm? 1250mm~1U=2.1μm 600mm?1 600mm 2000mm?U=2.6μm 1500mm 3000mm?U=3.2μm 2000mm 1303.JJG33-2002万能0?29 万能角度尺 角度 U=0.92’ 06 角度尺检定 -320? Q/HKT 10-2008惯 1303.性测量组合综合0?30 三轴转台 角度 U=0.42" 29 测试系统校准规-360? 范 U=(0.20+2?(0.5-100-610L)μm )mm L-mm 1308.JJG146-2003量31 量块 长度 04 块检定规程 U=(0.50+5?(30-500)-610L)μm mm L-mm 1303.JJG7-2004直角(315?32 宽座直角尺 角度 U =1.8μm 04 尺检定规程 200)mm No. CNAS L2874 第 75 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 CHINA NATIONAL ACCREDITATION SERVICE FOR CONFORMITY ASSESSMENT APPENDIX OF ACCREDITATION CERTIFICATE (Registration No. CNAS L2874) NAME:Metrology & Measurement Center of Hunan Spaceflight Management Bureau ADDRESS:No.217, Fenglin Sanlu, Yuelu District, Changsha, Hunan, China Accreditation Criteria:ISO/IEC 17025:2005 and relevant requirements of CNAS Date of Issue:2012-03-27 Date of Expiry:2015-03-26 Date of Update:2012-03-27 APPENDIX 3 ACCREDITED CALIBRATION Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field V.R. of DC Digital 0410.010mV,-6DC voltage Voltmeter U=8.3×10 rel1 1000V JJG315-1983 Only the (0.1,-5V.R. of DC Digital U=6.5×10 relmain 0410.0100)mA DC current Amperemeter calibrati3 -4JJG598-1989 (0.1,3)A U=6.9×10 relDigital on 1 parametV.R. of DC Digital All-porpuse Meter -5 0410.00.1Ω,U=1.0×10reler Resistance Ohmmeter ,-49 100MΩ 2.6×10 indicatioJJG724-1991 n error V.R. for AC digital 10mV, 0410.0Voltmeter JJG750V AC voltage View in next list 2 (Spaceflight)(3Hz, 34-1999 300kHz) No. CNAS L2874 第 76 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field AC voltage Frequency(Hz)Voltage Range 3-55-1010-20k20k-50k50k-100k100k-300k -4-4-4-4-3-3(10,100)mVU=2.1?10U=2.1?10U=1.8?10U=1.5?10U=1.1?10U=1.1?10 relrelrelrelrelrel -4-4-4-4-4-3 (0.1,1)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10relrelrelrelrelrel -4-4-4-4-4-3(1,10)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10relrelrelrelrelrel -4-4-4-4-4-3 (10,100)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10relrelrelrelrelrel -4-4-4-4-3-3(100,750)VU=1.7?10U=1.7?10U=1.7?10U=3.3?10U=1.0?10U=1.0?10relrelrelrelrelrel Only the (0.01,3)A -4U=5.8×10 relmain (3-5)Hz V.R. for AC digital calibrati (0.01,3)A Digital 0410.0Current Meter JJGon -3U=1.1×10 AC Current 1 rel(5,10)Hz 4 (Spaceflight )parametAll-porpuse Meter 35-1999 er (0.01,3)A -3indicatioU=4.9×10 rel10Hz,5kHz n error -30.1mV,1V U=3.0×10 rel0410.0DC voltage 1 -5 U=7.6×10rel(1,1000)V -4,7.2×10 V.R. of 0410.0-3DC current 0.1μA,5A U=6.7×10 relAmperemeters,Voltme3 Simulation ters,Wattmeters and 2 -2 0410.00.01Ω,U=2.1×10relAll-purpose Meter Resistance Ohmmeters -49 100MΩ ,6.5×10 JJG124-2005 0.1mV,-3U=1.5×10 rel10V 0410.0-4AC voltage (10,50)V U=4.5×10 rel2 -4(50,500)V U=2.7×10 rel 0410.0-3AC Current 0.1mA,5A U=5.5×10 rel4 V.R. of -3 0410.00.1mV,U=2.3×10relDC voltage Amperemeters,Voltme-41 1000V ,8.2×10 ters,Wattmeters and 3 Voltage Meter Ohmmeters -3 JJG124-2005 0410.00.1mV,U=3.2×10relAC voltage -42 1000V ,7.9×10 No. CNAS L2874 第 77 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field V.R. of 0410.0-3DC current 0.1μA,5A U=6.8×10 Amperemeters,Voltmerel3 ters,Wattmeters and 4 Current Meter Ohmmeters JJG124-2005 0410.0-3AC Current 0.1μA,5A U=7.3×10 rel4 V.R. of 0410.011mW,-4DC POWER U=8.5×10 Amperemeters,Voltmerel5 20kW ters,Wattmeters and 5 Power Meter Ohmmeters JJG124-2005 0410.0110mW,-3AC POWER U=1.1×10 rel5 20kW -30.1kΩ,U=1.2×10, rel Except -3100MΩ 2.6×10 V.R. of Megohmmeter Insulated for the JJG622-1997 Resistance 0410.0project: -2(0.1,10)GΩ U=2.3×10 relV.R. of Electronic 6 Megohm Meter 9 Short Insulating Resistance circuit Meters JJG1005-2005 -2Voltage (0,3)kV U=1.9×10 current rel V.R. of DC Standard 0409.00.1mV,-6DC voltage Voltage Source U=7.6×10 rel1 1000V JJG445-1986 10μA,-5U=2.1×10 rel33mA V.R. for Direct Accredit Current Standard ed Only 0409.0(33,-5DC current Source JJGU=6.5×10 for the rel3 330)mA (Spaceflight)main 38-1987 Multifunctional calibrati7 -4(0.33,20)A U=5.1×10 on relCalibration parametFountain er -5 DC 0409.0V.R. of D.C. Resistors 0.0001Ω,U=1.2×10rel indicatio-3Resistance 5 JJG166-1993 1.1GΩ ,3.5×10 n error V.R. for AC Standard 1mV, 0409.0Voltage Source 1000V AC voltage View in next list 2 JJG(Spaceflight)(10Hz, 2-1999 500kHz) No. CNAS L2874 第 78 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field AC voltage Frequency(Hz) Voltage Range 10-4545-10k10k-20k20k-50k50k-100k100k-500k -4-4-4-4-4-3 (1,33)mVU=3.7?10U=2.8?10U=2.8?10U=4.8?10U=6.5?10U=1.4?10relrelrelrelrelrel -4-5-5-4-4-4(33,330)mVU=1.2?10U=6.3?10U=6.3?10U=1.0?10U=2.1?10U=5.3?10relrelrelrelrelrel -5-5-5-5-4-4(0.33,3.3)VU=7.7?10U=2.9?10U=2.9?10U=5.6?10U=1.9?10U=3.0?10relrelrelrelrelrel -4-5-5-5-4-4 (3.3,33)VU=3.8?10U=5.4?10U=5.4?10U=6.8?10U=1.1?10U=2.3?10relrelrelrelrelrel Frequency(Hz) Voltage Range 45-1k1k-10k10k-20k20k-50k50k-100k/ -4-5-5-4-4 (33,330)VU=2.3?10U=4.0?10U=8.0?10U=1.1?10U=2.4?10/relrelrelrelrel Frequency(Hz)Voltage Range 45-1k1k-5k5k-10k/// -4-5-4(330,1000)VU=4.7?10U=4.5?10U=4.4?10///relrelrel V.R. for AC Standard 0.1mA, 0410.0Current Source 20A AC Current View in next list 4 JJG(Spaceflight)(10Hz, 51-1999 50kHz) AC Current Frequency(Hz) Current Range10-2020-4545-1k1k-5k5k-10k10k-30k Accredit-4-4-4-4-4-4(29,330)μAU=5.9?10U=5.8?10U=5.8?10U=4.7?10U=7.2?10U=8.3?10relrelrelrelrelrel ed Only -4-4-4-4-4-4(0.33,3.3)mAU=1.6?10U=1.0?10U=3.8?10U=1.2?10U=4.7?10U=7.5?10relrelrelrelrelrel for the -4-4-4-4-4-4(3.3,33)mAU=1.4?10U=1.2?10U=1.2?10U=1.2?10U=1.7?10U=4.3?10relrelrelrelrelrel main -4-5-5-5-4-4(33,330)mAU=1.3?10U=9.9?10U=5.0?10U=9.6?10U=5.8?10U=4.2?10relrelrelrelrelrel Multifunctional calibrati Frequency(Hz)7 on Current RangeCalibration 10-4545-1k1k-5k5k-10k// paramet-4-4-4-4Fountain (0.33,1.1)AU=2.4?10U=2.4?10U=2.3?10U=1.2?10//relrelrelrel er -4-4-4-4(1.1,3)AU=2.9?10U=7.8?10U=5.9?10U=2.9?10//relrelrelrel indicatioFrequency(Hz) n error Current Range45-100100-1k1k-5k/// -4-4-4(3,11)AU=5.1?10U=4.7?10U=4.7?10///relrelrel -4-4-4(11,20)A=5.9?10=5.8?10=5.8?10///UUUrelrelrel Except for the 0426.0500V,-2DC voltage U=3.1×10 relproject: 1 10000V V.R. of Withstanding Actual Endure Voltage Voltage Testers output 8 Tester JJG795-2004 capacity 0426.0500V,,DC -2AC voltage U=2.6×10 rel2 10000V voltage ripple No. CNAS L2874 第 79 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field coefficie nt 0410.0(0.1,-3DC current U=1.6×10 rel,AC 3 100)mA voltage distortio n 0410.0(0.1,,Dielectr-4AC Current U=8.0×10 rel4 100)mA ic strength test 0412.0-3Duration 1s,15min U=7.7×10 rel4 Except for the V.R. of D.C. project: -5 DC Resistance 0402.00.01Ω,U=1.3×10relResistance Resistance Box Dielectri 9 -41 100MΩ ,2.6×10 Case JJG982-2003 c strength test (0.01,-4U=5.9×10 rel100)mV 0425.0DC voltage 1 -3 0.1V,U=5.7×10rel -41000V ,8.2×10 V.R. for DC Voltage DC Firm Voltage 0425.0Stable Source -3DC current (0,30)A U=8.7×10 10 rel1 JJG(Spaceflight )6-19Power 99 Veins Wave 0425.0(0.01,-3Voltage U=2.6×10 rel2 100)mV Virtual Value Veins Wave 0425.0(0.01,-2Voltage U=3.6×10 rel2 300)mV Peak Value No. CNAS L2874 第 80 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field 0409.0-2Voltage 1mV~20V U=1.6 ×10 rel1 V.R. of Low Frequency 0412.0Low-frequency Signal -6Frequency 10Hz~1MHz U=1.8×10 11 rel8 Generator Signal Generator JJG602-1996 0413.0-2Distortion 0.01%~30% U=7×10 rel4 V.R. of Crystal Oscillator Inside the 0412.0Electrical 5MHz、 -9Frequency U=3.6×10 12 Frenquency Meter 1 Measurement 10MHz Instrument JJG180-2002 0406.0-3Inductance 0.1mH~10H U=1.2×10 rel1 V.R. for Wide Range LCR Measure Digital RLC Meter 13 Meter GJB/J5412-2005 0404.0-3Capacitance 500pF~1μF U=7.1×10 rel1 0413.0-2Rise up time ,500ps U=2.1×10 rel3 V.R. of Analogue Osilloscope 14 Oscillogragh JJG262-1996 Scan time 0413.0-35ns~50s U=5.0×10 relsubmultiple 3 Aplomb V.R. of Analogue 0413.0-3deflexion Osilloscope 2mV~200V U=6.2×10 14 Oscillogragh rel5 quotiety JJG262-1996 No. CNAS L2874 第 81 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field Frequency 0413.0DC~1000MU=2.8 relband wide 1 Hz 10Hz~ -3 The basic U=1.2×10relV.R. of Electronic 500kHz -3scale ,7.2×10 Voltmeter 1mV~1000V Electronic 0409.0JJG250-1990 15 2 V.R. for Wide Band Voltmeter 10Hz~ Electronic Voltmeter -3 Frequency U=3.7×10rel1000MHz GJB/J3411-1998 -2response , 1.1×10 0.3V~1.5V C.S. for the 1514.0Temperature (-80~300)? U=0.4? Equipment of the 2 Environment Environmental Testing for 16 Examination Temperarure and Equipment 1517.030%RH~98Humidity Humidity U=1.8%RH 2 %RH JJF1101-2003 (0-25)mm U=1.4μm (25-50)mm U=1.5μm (50-75)mm U=1.6μm (75-100)U=1.7μm mm (100-125)U=1.8μm mm (125-150)Outer Dia. 1303.1V.R. of Micrometer U=1.9μm Length 17 mm 8 JJG21-2008 Micrometer (150-175)U=2.0μm mm (175-200)U=2.2μm mm (200-225)U=2.3μm mm (225-250)U=2.4μm mm (250-275)U=2.6μm mm No. CNAS L2874 第 82 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field (275-300)U=2.7μm mm (300-325)U=2.8μm mm (325-350)U=2.9μm mm (350-375)U=3.2μm mm (375-400)U=3.3μm mm (400-425)U=3.4μm mm (425-450)U=3.6μm mm (450-475)U=3.7μm mm (475-500)U=4.0μm mm V.R. of the (0-25)mm U=1.2μm The Micrometers Micrometers with 1303.2Length Dial Comparator and 18 with Dial 9 Indicating Snap Comparator (25-50)mm U=1.6μm Gauge JJG26-2001 (50-75)mm U=1.7μm V.R. of the The Micrometers Micrometers with 1303.2(75-100)Length Dial Comparator and U=1.9μm 18 with Dial 9 mm Indicating Snap Comparator Gauge JJG26-2001 (5-30) mm U=1.2μm (25-50) U=1.5μm mm C.S. for Micrometers Micrometers for (50-75) 1303.2for Measuring Inside U=1.7μm Length 19 Measuring Inside mm 9 Dimension Dimension JJF1091-2002 (75-100) U=1.8μm mm (100-125) U=1.9μm mm (125-150) U=2.2μm mm No. CNAS L2874 第 83 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field (0-25)mm U =1.2μm V.R. of Common Common Normal 1303.2(25-50)mm U =1.4μm Length Normal Micrometer 20 9 Micrometer JJG82-2010 (50-75)mm U =1.6μm (75-100)U =1.7μm mm (0-25)mm U =0.8μm (25-50)mm U =0.83μm (50-75)mm U =0.84μm V.R. of Depth 1303.2Length Micrometers 21 Depth Micrometer 9 JJG24-2003 (75-100)U =0.87μm mm (100-125)U =0.95μm mm (125-150)U =0.99μm mm (150-175)U =1.2μm V.R. of Depth mm 1303.2Length Micrometers 21 Depth Micrometer 9 JJG24-2003 (175-200)U =1.2μm mm (0-150)mm U=8.2μm (0-200)mm U=8.4μm 1303.2V.R. of Current Length (0-300)mm U =8.6μm 22 Currency Calipers 3 Calipers JJG30-2002 (0-500)mm U =9.5μm (0-1000)U =24μm mm (0-300)mm U =9.5μm 1303.2V.R. of Height Caliper Length 23 Height Calipers 9 JJG31-2011 (0-500)mm U =15μm No. CNAS L2874 第 84 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field 75mm 125mm U=0.33μm 175mm 1303.0V.R. of Straight Edge Beeline 24 Straight Edge 200mm 3 JJG63-2007 U=0.50μm 225mm 300mm U=0.66μm Dial indicator(Re(0-3)mm U=3.6μm ading (0-5)mm U=4.8μm 0.01mm) (0-10)mm U=5.7μm (0-10)mm 1303.1V.R. of Dial Gauges Length 25 Dial Gauges 5 JJG34-2008 Dial indicator(Re ading U=2.2μm 0.001mm) (0-1)mm (6-10)mm U=2.8μm (10-18)mmC.S. for Bore Dial U=3.5μm Bore Dial 1303.1(18-35)mmLength Indicators U=4.8μm 26 5 (35-50)mmIndicators JJF1102-2003 U=5.3μm (50-450)U=6.2μm mm Dial indicator(Re1303.1V.R. of Dial Gauges Length ading U=1.2μm 27 Dial Gauges 5 JJG34-2008 0.001mm) (0-0.2)mm Dial indicator(Re1303.1V.R. of Dial Gauges Length ading U=3.8μm 27 Dial Gauges 5 JJG34-2008 0.01mm) (0-0.8)mm 160mm×100 mm~ U=0.6μm 250mm×160 mm 250mm×250 1303.0V.R. of Surface mm~ Plane Degree U=0.8μm 28 Surface Plates 1 Plates JJG117-2005 300mm×300 mm 400mm×250 mm~ U=1.0μm 630mm×400 mm No. CNAS L2874 第 85 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field 630mm×630 mm~ U=1.2μm 800mm×500 mm 800mm×800 mm~ U=1.5μm 1000mm×75 0mm 1000mm×10U=1.8μm 00mm 1250mm×12 50mm~1600U=2.1μm mm×1600m m 2000mm×15U=2.6μm 00mm 3000mm×20U=3.2μm 00mm V.R. of Universal Universal Bevel 1303.0Angle Bevel Protractors 0?-320? U=0.92’ 29 6 Protractors JJG33-2002 C.S. for inertia Rotate Platform 1303.2measure combination Angle 0?-360? U=0.42" 30 9 colligation test system With 3 Axeses Q/HKT 10-2008 -61308.0V.R. of Gauge Block U=(0.20+2×10L)μm Length (0.5-100)mm 31 Gauge Block 4 JJG146-2003 L-mm -61308.0V.R. of Gauge Block U=(0.50+5×10L)μm Length (30-500)mm 31 Gauge Block 4 JJG146-2003 L-mm 1303.0V.R. of Squares (315×200)Angle U =1.8μm 32 Wide Seat Square 4 JJG7-2004 mm No. CNAS L2874 第 86 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 中国合格评定国家认可委员会 认 可 证 书 附 件 (注册号:CNAS L2874) 名称: 湖南航天管理局计量检测中心 地址:湖南省长沙市岳麓区枫林三路217号 签发日期:2012年03月27日 有效期至:2015年03月26日 更新日期:2013年06月04日 附件1 认可的授权签字人及领域 序号 姓 名 授权签字领域 备 注 1 吴平 全部检测项目和校准项目 2 王杰 电气设备环境试验检测项目 3 张军生 几何量、热学校准项目 No. CNAS L2874 第 87 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 CHINA NATIONAL ACCREDITATION SERVICE FOR CONFORMITY ASSESSMENT APPENDIX OF ACCREDITATION CERTIFICATE (Registration No. CNAS L2874) NAME:Metrology & Measurement Center of Hunan Spaceflight Management Bureau ADDRESS:No.217, Fenglin Sanlu, Yuelu District, Changsha, Hunan, China Date of Issue:2012-03-27 Date of Expiry:2015-03-26 Date of Update:2013-06-04 APPENDIX 1 ACCREDITED SIGNATORIES AND SCOPE ? Name Authorized Scope of Signature Note 1 Wuping All calibration of test items Approved electrical equipment 2 Wangjie environmental test items Recognition of geometric、thermal 3 Zhangjunsheng quasi-school project No. CNAS L2874 第 88 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 中国合格评定国家认可委员会 认 可 证 书 附 件 (注册号:CNAS L2874) 名称: 湖南航天管理局计量检测中心 地址:湖南省长沙市岳麓区枫林三路217号 认可依据:ISO/IEC 17025:2005以及CNAS特定认可要求 签发日期:2012年03月27日 有效期至:2015年03月26日 更新日期:2013年06月04日 附件2 认可的检测能力范围 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测: 0418.0GB/T5729-2003 5 固定电阻器 1 电阻值 (0,2) 1 第一部分:总规范 MΩ 外观和尺寸 1 只测: 检查 GB/T2693-2001 0418.0容值? 6 固定电容器 电子设备用固定电容器 2 1F，频率2 绝缘电阻 第一部分:总规范 ?2MHz 3 耐电压 4 电容量 No. CNAS L2874 第 89 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测: 损耗角正切GB/T2693-2001 5 0418.0容值?和等效电阻 6 固定电容器 电子设备用固定电容器 2 1F，频率 第一部分:总规范 ?2MHz 6 漏电流 1 外观检查 尺寸的测量2 GB/T8554-1998 只测:频和检验 0418.0 7 固定电感器 电子和通信设备用变压器和率?绕阻直流电8 3 电感器测量方法及试验程序 2MHz 阻 4 绝缘电阻 5 品质因数 6 有效电感 外观(包括 1 尺寸、质量) 2 互换性 3 接触电阻 低频电连接0418.0QJ1903-1990 8 器 5 电连接器总规范 外壳间的电4 连续性 5 绝缘电阻 6 耐压 1 设计和结构 GJB65B-2000 0418.02 绝缘电阻 9 电磁继电器 有可靠性指标的电磁继电器 7 3 介质耐压 总规范 4 电性能 5 标志 No. CNAS L2874 第 90 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 GJB65B-2000 6 加工质量 0418.0 9 电磁继电器 有可靠性指标的电磁继电器 7 总规范 7 玻璃绝缘子 1 绝缘电阻 2 介质耐电压 0423.0GJB809A-1997 10 微动开关 3 接触电阻 3 微动开关通用规范 4 标记 5 制造质量 1 外观 2 尺寸 密封钮子开0423.0GJB735-1989 11 3 接触电阻 关 3 密封钮子开关总规范 4 绝缘电阻 5 介质耐压 只测: 0424.0 1 导体电阻 绝缘电 1 阻? 安装线缆GB/T3048-2007 电线电缆电 12 5000MΩ (非高频) 性能试验方法 交流电 压?0424.02 绝缘电阻 2500V 2 交流电压试0424.0 3 验 5 只做:频 石英晶体谐0418.0GJB2138-1994 13 1 绝缘电阻 率? 振器 8 石英晶体元件总规范 30MHz No. CNAS L2874 第 91 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 2 频率 只做:频 石英晶体谐0418.0GJB2138-1994 13 率?3 密封 振器 8 石英晶体元件总规范 30MHz 4 标志 5 加工质量 只做:频1 密封 石英晶体振0418.0GJB1648A-2011 14 率? 荡器 8 晶体振荡器总规范 500MHz 2 频率 反向电流 1 只测:正 IR 向电压 GB/T6571-1995 (-10, 0418.0半导体器件分立器件第3部 15 二极管 ，10)V; 3 分:信号(包括开关)和调 反向电正向电压 2 整二极管 压VF ?1500V 工作电压 3 VZ 微分电阻4 rZ 电流传输比 1 hF(ctr) GB/T15651-1995 0418.0 集电极-发16 光电耦合器 半导体器件分立器件和集成 3 射极饱和电电路第5部分:光电子器件 2 压 Vce(sat) No. CNAS L2874 第 92 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 集电极-基 1 极截止电流 ICBO 0418.0只测:饱 3 集电极-发和电压2 射极截止电(-10, 流ICEO ，10)V; GB/T4587-1994 发射极-基反向电 17 晶体管 3 半导体分立器件和集成电路 极截止电流压 第7部分:双极型晶体管 IEBO ?1500V 集电极-发 ;电流 射极击穿电 4 (-4, 压V(BR) ，4)A CEO 集电极-基 5 极击穿电压 V(BR)CBO 发射极-基0418.0 6 极击穿电压3 V(BR)EBO 集电极-发 7 射极饱和电 压VCEsat No. CNAS L2874 第 93 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测:饱 和电压 (-10, 基极-发射 ，10)V; 8 极饱和电压 GB/T4587-1994 0418.0反向电 VBEsat 17 晶体管 半导体分立器件和集成电路 3 压 第7部分:双极型晶体管 ?1500V ;电流 (-4, 放大倍数，4)A 9 hFE 栅极截止电0418.0 1 只测:电 流IGSS 3 压:? GB/T4586-1994 场效应晶体1500V; 18 半导体器件分立器件 第9部 管 电流 分:场效应晶体管 漏极截止电(-40,2 流IDSS ，40)A 0418.0 栅-源阈值4 3 电压 VGS(th) 输入失调电 半导体集成1 SJ/T10738-1996 压VIO 0418.0 19 电路运算放半导体集成电路运算(电压) 7 大器 输入失调电放大器测试方法的基本原理 2 流IIO No. CNAS L2874 第 94 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 输入偏置电 3 流IIb 静态功耗 4 PD 半导体集成SJ/T10738-1996 0418.0 19 电路运算放开环电压增半导体集成电路运算(电压) 5 7 益AVD 大器 放大器测试方法的基本原理 共模抑制比6 KCMR 电源电压抑7 制比KSVR 输出电压 1 VO 只测:电 压 (-50,三端稳压电GB/T4377-1996 0418.0，50)V; 20 源(电压调半导体集成电路电压调整器 7 电流电压调整率整器) 2 测试方法的基本原理 (-0.1SV ,，电流调整率 3 0.1)A SI 纹波抑制比 4 SIip 基准电压5 VREF 半导体集成GB/T6798-1996 输入失调电0418.0 21 电路电压比1 半导体集成电路电压比较器 压VIO 7 较器 测试方法的基本原理 No. CNAS L2874 第 95 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 输入失调电 2 流IIO 输入偏置电 3 流IIb 半导体集成GB/T6798-1996 0418.0 21 电路电压比静态功耗半导体集成电路电压比较器 4 7 PD 较器 测试方法的基本原理 开环电压增5 益AVD 输出低电平6 电压VOL 输入钳位电 1 压VIK 输出高电平2 电压VOH 输出低电平 3 电压VOL 输入电流4 半导体集成SJ/T10735-1996 0418.0II 22 电路TTL电半导体集成电路TTL电路测 7 输入高电平 路 5 试方法的基本原理 电流IIH 输入低电平 6 电流IIL 输出短路电7 流IOS 输出高阻态 8 时高电平电 流IOZH No. CNAS L2874 第 96 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 输出高阻态 9 时低电平电 流IOZL 电源电流 10 半导体集成SJ/T10735-1996 ICC 0418.0 22 电路TTL电半导体集成电路TTL电路测 输出高电平7 路 11 试方法的基本原理 电源电流 ICCH 输出低电平 12 电源电流 ICCL 输入高电平 1 电压VIH 输入低电平 2 电压VIL 输出高电平3 电压VOH 半导体集成输出低电平SJ/T10741-2000 4 0418.0 电压VOL 23 电路CMOS半导体集成电路CMOS电路测 7 电路 输入高电平试方法的基本原理 5 电流IIH 输入低电平6 电流IIL 输出高电平7 电流IOH 输出低电平 8 电流IOL No. CNAS L2874 第 97 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 输出高阻态 9 时高电平电 流IOZH 半导体集成SJ/T10741-2000 0418.0输出高阻态 23 电路CMOS半导体集成电路CMOS电路测 10 7 时低电平电 电路 试方法的基本原理 流IOZL 电源电流11 IDD 输出电压 1 VO 只测: 输入电 压: (0, SJ20646-1997 ?40)V, 0418.0 24 DC/DC模块 混合集成电路DC/DC变换器输入电输出电流7 2 测试方法 流(0,IO ?10)A 输出纹波电 3 负载:压Vrip (0, 电压调整率4 ?10)A SV 电流调整率5 SI 6 交叉调整率 输入电流 7 II No. CNAS L2874 第 98 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测: 输入电 压: (0, SJ20646-1997 ?40)V, 0418.0 24 DC/DC模块 8 效率η 混合集成电路DC/DC变换器 输入电 7 测试方法 流(0, ?10)A 负载: (0, ?10)A 只测:体 积:? 60cm?6 1 外观目检 0cm?60 cm;温度 范围: -55?, 125? 2 温度循环 集成电路筛0418.0GJB548B-2005 25 选 7 微电子器件试验方法和程序 3 低温测试 只做:温 度范围: -55?, 125? 4 高温测试 No. CNAS L2874 第 99 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只做:老 炼温 度:?12 5?;频 率 ?1MHz， 管脚 ?48DIP 的54/74 系列数 字芯片、 LM199/2 99/399、 F007/FO P07/F74 1、 LM124、 LM158/2 58/358、 F353/13 集成电路筛0418.0GJB548B-2005 6模拟芯 25 5 老炼 片;137选 7 微电子器件试验方法和程序 系列、78 系列、79 系列、 117系列 三端稳 压器; JMD03/2 4S15、 JMD10 28S05、 JMD 24D15-2 5、 HHW28D/ S、 HHF28D/ S、 HSA28S 系列 DC/DC模 块 No. CNAS L2874 第 100 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只做:条 密封-细检 6 件A1、 漏 A2 集成电路筛0418.0GJB548B-2005 25 选 7 微电子器件试验方法和程序 只做:条 密封-粗检 7 件C1、 漏 C2 1 外观检查 只做:体 积:? 60cm?6 0cm?60 2 温度循环 cm;温度 范围: -55?,半导体分立0418.0GJB128A-1997 125? 26 器件筛选 7 半导体分立器件试验方法 只测:温 3 高温测试 度范围: -55?, 125? 4 低温测试 只测:功 率老炼: 5 老炼 (0, 150)W No. CNAS L2874 第 101 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测:反 偏电压: (0, 6 高温反偏 1000)V; 老炼温半导体分立0418.0GJB128A-1997 度: 26 器件筛选 7 半导体分立器件试验方法 ?125? 密封-粗检只做:条7 漏 件C 只测:条密封-细检 8 件H1、漏 H2 GB/T5729-2003 1 外观检查 电子设备用固定电阻器总规 范 只测:体0418.0 27 电阻器筛选 积:?1 60cm?6 GJB360B-2009 0cm?60 2 温度循环 电子及电气元件试验方法 cm;温度 范围: -55?, 125? GB/T2693-2001 0418.0 28 电容器筛选 1 外观检查 电子设备用固定电容器总规2 范 No. CNAS L2874 第 102 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 项目/参数 序检测 领域 检测标准(方法)名称限制 说明 号 对象 代码 及编号(含年号) 范围 序号 名称 只测:体 积:? 60cm?6 0cm?60 2 温度循环 cm;温度 范围: 0418.0GJB360B-2009 -55?,28 电容器筛选 2 电子及电气元件试验方法 125? 只测:电 压:(0, 3 高温老炼 600)V; 温度: ?125? No. CNAS L2874 第 103 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 CHINA NATIONAL ACCREDITATION SERVICE FOR CONFORMITY ASSESSMENT APPENDIX OF ACCREDITATION CERTIFICATE (Registration No. CNAS L2874) NAME:Metrology & Measurement Center of Hunan Spaceflight Management Bureau ADDRESS:No.217, Fenglin Sanlu, Yuelu District, Changsha, Hunan, China Accreditation Criteria:ISO/IEC 17025:2005 and relevant requirements of CNAS Date of Issue:2012-03-27 Date of Expiry:2015-03-26 Date of Update:2013-06-04 APPENDIX 2 ACCREDITED TESTING Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Fixed resistors for Accredited use in electronic only for:Resistor 5 Fixation resistor 1 0418.01 equipment-Part1:Ge value Resistance neric specification ?2MΩ GB/T5729-2003 Surface & 1 Size Fixed capacitors for Accredited checkup use in electronic only for: 6 Fixation capacitor 0418.02 equipment-Part1:GeInsulated value?1F，2 neric specification resistor freq?2MHz GB/T2693-2001 Endure 3 voltage 4 Capacitance No. CNAS L2874 第 104 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Ullage Fixed capacitors for Accredited tangent and 5 use in electronic only for:equivalent 6 Fixation capacitor 0418.02 equipment-Part1:Geresistor value?1F，neric specification freq?2MHz GB/T2693-2001 Leak 6 current Surface 1 checkup Tranformer and inductors for use in electronic and Size Accredited Fixation telecommunication 2 measure & 7 0418.08 only for:0,inductance equipment checkup 2MHz Mesauring methods Coil DC 3 and test procedures resistor GB/T8554-1998 Insulated 4 resistor Quality 5 factor Availability 6 inductance Surface(incl 1 ude size,mass) Electrical linkerchief Low frequency 8 Interconvert 0418.05 standard electrical linker 2 QJ1903-1990 character Contact 3 resistor No. CNAS L2874 第 105 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Crusts 4 electric continuity Electrical linkerchief Low frequency 8 Insulated 0418.05 standard electrical linker 5 resistor QJ1903-1990 Endure 6 voltage Design & 1 Structure Insulated 2 Relays resistor electromagnetic,estaMedium Electromagnetism blished 3 endure 9 0418.06 relay reliablilty ,general voltage specification for Electricity 4 GJB65B-2000 capability 5 Sign Machining 6 quality Glass 7 insulation organ Insulated 1 Switches,sensitive ,gresistor eneral specification 10 sensitive Switches 0423.03 for Medium GJB809A-1997 2 endure voltage No. CNAS L2874 第 106 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Contact 3 Switches,sensitive ,gresistor eneral specification 10 sensitive Switches 0423.03 for 4 Sign GJB809A-1997 Pruduct 5 quality 1 Surface Switches,toggle 2 Size environmentally Pressurize button 11 0423.03 sealed,general Contact switch 3 specification for resistor GJB735-1989 Insulated 4 resistor Medium 5 endure voltage Accredited Conductor only for:1 0424.01 Test methods for resistor Insulated Installation electrical properties resistor value12 cable(within high of electric cables frequency) and wires ?5000MΩ、 GB/T3048-2007 AC voltage?Insulated 2 0424.02 resistor 2500V AC voltage 3 0424.05 Test No. CNAS L2874 第 107 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Insulated 1 resistor Crystal units，Accredited Quartz crystal quartz， general only for:freq13 0418.08 2 Frequency syntony organ specification for ?30MHz 3 Pressurize GJB2138-1994 4 Sign Machining 5 quality Oscillators, crystal Accredited 1 Pressurize Quartz crystal general specification only for:freq14 0418.08 surge organ for ?500MHz GJB1648A-2011 2 Frequency Countercurr1 ent Ir Semiconductor Accredited devices-discrete only for:VFdevices Part (-10,，3:Singal(include 15 Diode 418.03 Positive 10)V;VBRswitch)and regular 2 favor voltage VF ?1500V diode GB/T6571-1995 Work 3 voltage VZ Differential 4 coefficient resistor rZ No. CNAS L2874 第 108 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Current Semiconductor 1 transers devices Discrete ratio hF(ctr) devices and Photoelectricity integrated circuits 16 0418.03 coupling organ Part 5:Optoelectronic Collector-trdevices ansmit pole GB/T15651-1995 2 saturation voltage Vce(sat) Collector-ba sic pole 1 cut-off current Accredited ICBO Semiconductor only discrete devices and for:VoltageCollector-trintegrated circuits (-10,，17 Transistor 0418.03 ansmit pole Part 7:Bipolar 10)V;VBR2 cut-off transistors ?1500V;IOcurrent GB/T4587-1994 (-4,，4)A ICEO Collector-ba sic pole 3 cut-off current IEBO No. CNAS L2874 第 109 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited Semiconductor only Collector-trdiscrete devices and for:Voltageansmit pole integrated circuits (-10,，17 Transistor 4 strike out 0418.03 Part 7:Bipolar 10)V;VBRvoltage transistors V(BR) CEO ?1500V;IOGB/T4587-1994 (-4,，4)A Collector-ba sic pole 5 strike out voltageV(B R)CBO transmit pole-basic Accredited 6 pole strike Semiconductor only out voltage discrete devices and for:VoltageV(BR)EBO integrated circuits (-10,，17 Transistor 0418.03 Collector-trPart 7:Bipolar 10)V;VBRansmit pole transistors ?1500V;IO7 saturation GB/T4587-1994 (-4,，4)A voltage VCEsat basic pole-transm 8 it saturation voltageVBE sat Blowup 9 multiple hFE No. CNAS L2874 第 110 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Bar pole cut-off 1 current Accredited IGSS only Semiconductor unit for:Voltage:schism unit part Scene domino leak pole ?1500V;18 0418.03 8:scene domino offect transistor cut-off offect transistor Current2 current GB/T4586-1994 (-40,， IDSS 40)A Bar-fountio n threshold 3 value voltage VGS(th) Input malajustme1 General principles nt voltage of measuring VIO methods of Semiconductor IC operational(voltage) 19 0418.07 operation amplifier amplifiers for Input semioconductor malajustme2 integrated circuits nt current SJ/T10738-1996 IIO Input 3 leaning set current IIb No. CNAS L2874 第 111 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Static work 4 PD General principles of measuring Openning methods of annulus Semiconductor IC operational(voltage) 5 19 0418.07 voltage plus operation amplifier amplifiers for AVD semioconductor share integrated circuits SJ/T10738-1996 module 6 restrain ratio KCMR Power and Voltage 7 restrain ratio KSVR Accredited Semiconductor only Output integrated for:Voltage 1 voltage VO circuits General (-50,，Voltage adjust 20 0418.07 principles of 50)V;organ measuring methods Currentof voltage regulator (-0.1,，GB/T4377-1996 Voltage 0.1)A 2 adjust ratio SV No. CNAS L2874 第 112 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Current Accredited 3 adjust ratio Semiconductor only SI integrated for:Voltage circuits General (-50,，Voltage adjust 20 0418.07 principles of 50)V;organ measuring methods CurrentVeins wave of voltage regulator (-0.1,，4 restrain GB/T4377-1996 0.1)A ratio SIip Basic 5 voltage VREF Input malajustme1 nt voltage Semiconductor VIO integrated circuits General Semiconductor IC principles of Input 21 voltage compare 0418.07 measuring methods malajustmeorgan 2 of voltage nt current comparators IIO GB/T6798-1996 Input 3 leaning set current IIb Static work 4 PD No. CNAS L2874 第 113 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Openning Semiconductor annulus 5 integrated voltage plus circuits General AVD Semiconductor IC principles of 21 voltage compare 0418.07 measuring methods organ of voltage Output low comparators electricity GB/T6798-1996 6 calm voltage VOL Input grip 1 digit voltage VIK General principles Output high of measuring electricity methods of TTL 2 calm 22 Semiconductor IC 0418.07 circuits for voltage semiconductor VOH integrated circuits Output low SJ/T10735-1996 electoricity 3 calm voltage VOL Input 4 current II No. CNAS L2874 第 114 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Input high electricity 5 calm current General principles IIH of measuring methods of TTL Semiconductor 22 0418.07 circuits for Input low IC semiconductor electricity 6 integrated circuits calm current SJ/T10735-1996 IIL Output short 7 circuit current IOS Output high electricity calm current 8 in high resistor General principles value state of measuring IOZH methods of TTL Output high 22 Semiconductor IC 0418.07 circuits for electricity semiconductor calm current integrated circuits 9 in low SJ/T10735-1996 resistor value state IOZL Power 10 current ICC No. CNAS L2874 第 115 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Output high electricity General principles 11 calm power of measuring current methods of TTL ICCH 22 Semiconductor IC 0418.07 circuits for semiconductor Output low integrated circuits electricity SJ/T10735-1996 12 calm power current ICCL Input high Semiconductor electricity 1 integrated circuits calm power General principles voltage VIH CMOS 23 0418.07 of measuring semiconductor IC methods for CMOS circuits Input low SJ/T10741-2000 electricity 2 calm power voltage VIL Semiconductor Output high integrated circuits electricity General principles CMOS 23 3 calm power 0418.07 of measuring semiconductor IC voltage methods for CMOS VOH circuits SJ/T10741-2000 No. CNAS L2874 第 116 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Output low electricity 4 calm power voltage VOL Input high electricity 5 calm power current IIH Input low Semiconductor electricity 6 integrated circuits calm power General principles current IIL CMOS 23 0418.07 of measuring semiconductor IC Output high methods for CMOS electricity circuits 7 calm power SJ/T10741-2000 current IOH Output low electricity 8 calm power current IOL Output high electricity calm current 9 in high resistor value state IOZH No. CNAS L2874 第 117 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Outputlow electricity Semiconductor calm current integrated circuits 10 in low General principles CMOS resistor 23 0418.07 of measuring semiconductor IC value state methods for CMOS IOZL circuits SJ/T10741-2000 Power 11 current IDD Output 1 voltage VO Accredited only for: Output The measuring 2 Input:0,?current IO methods of 40V,0,?out veins DC/DC converters 24 DC/DC module 0418.07 3 wave 10A;Load 1:for hybird integrated voltage Vrip circuits 0,? Voltage SJ20646-1997 10A,Load 2: 4 adjust ratio 0,?10A SV Current 5 adjust ratio SI cross adjust 6 ratio Input 7 current II No. CNAS L2874 第 118 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited only for: The measuring Input:0,?methods of 40V,0,?effect ratio DC/DC converters 24 DC/DC module 8 0418.07 10A;Load 1:η for hybird integrated circuits 0,? SJ20646-1997 10A,Load 2: 0,?10A Accredited only for: Size:?60cmSurface eye 1 ?60cm?checkout 60cm;Temp range: Test methods and -55?,Procedures for Temperature 125? 2 25 IC filter 0418.07 microelectronic circle device GJB548B-2005 Low Accredited 3 temperature only for: text temp range: -55?, High 125? 4 temperature text No. CNAS L2874 第 119 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited only for: Aging temp: ?125?; frequency? 1MHz,pin? 48P and 54/74 series digital chip,LM199/ 299/399,F007 /FOP07/F741, LM124,LM15 Aging Test methods and 58/258/358,F Procedures for 353/136 draft 25 IC filter 0418.07 microelectronic Chip,137/7/7 device 9/117 series GJB548B-2005 manostat,JM D03/24S15,J MD10 28S05,JMD 24D15-25,H HW28D/S,H HF28D/S,HS A28S series DC/DC module. Pressurize-sAccredited lender only for:6 check up A1,A2 the leak No. CNAS L2874 第 120 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Test methods and Accredited Pressurize-gProcedures for only for:25 IC filter 7 ruff check 0418.07 microelectronic up the leak device C1,C2 GJB548B-2005 surface 1 checkup Accredited only for: Volume:? 60cm?60cmTemperature 2 ?60cm;circle Temp range: Test methods For -55?,Semiconductor semiconductor 125? 26 discrere devices 0418.07 discrere devices filter GJB128A-97 High Accredited 3 temperature only for:temp text range: -55?,Low 125? 4 temperature text Accredited only for: 5 Aging power Aging: (0,150)W No. CNAS L2874 第 121 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited only for: High Reverse temperature voltage:(0,6 reverse 1000)V;leaning Test methods For Aging temp Semiconductor semiconductor ?125? 26 discrere devices 0418.07 discrere devices Pressurize-gfilter Accredited GJB128A-1997 7 ruff check only for:C up the leak Pressurize-sAccredited lender 8 only for: check up H1,H2 the leak Fixed resistors for use in electronic Surface 1 equipment-Part1:Ge checkup neric specification GB/T5729-2003 Accredited only for:27 Resistor filter 0418.01 Test methods of Volume:? electronic and 60cm?60cmTemperature 2 electrical component circle ?60cm;parts Temp range:GJB360B-2009 -55?, 125? Fixed capacitors for use in electronic Surface 28 Capacitor filter 1 0418.02 equipment-Part1:Ge checkup neric specification GB/T2693-2001 No. CNAS L2874 第 122 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Item/Parameter Code of Title, Code of Test Object Limitation Note ? Item/ Field Standard or Method ? Parameter Accredited only for: Volume:? 60cm?60cmTemperature 2 ?60cm;circle Test methods of Temp range: electronic and -55?, 28 Capacitor filter 0418.02 electrical component 125? parts Accredited GJB360B-2009 only for: High Voltage:(0, 3 temperatute 600)V;aging Temp:? 125? No. CNAS L2874 第 123 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 中国合格评定国家认可委员会 认 可 证 书 附 件 (注册号:CNAS L2874) 名称: 湖南航天管理局计量检测中心 地址:湖南省长沙市岳麓区枫林三路217号 认可依据:ISO/IEC 17025:2005以及CNAS特定认可要求 签发日期:2012年03月27日 有效期至:2015年03月26日 更新日期:2013年06月04日 附件3 认可的校准能力范围 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) JJG315-1983《直只做0410.10mV,-6直流电压 流数字电压表检U=8.3?10 rel主要01 1000V 定规程》 校准 参量1 数字多用表 示值 误差 (0.1,的校-5U=6.5?10 JJG598-1989《直rel100)mA 准 0410.直流电流 流数字电流表检03 定规程》 (0.1,-4U=6.9?10 rel3)A No. CNAS L2874 第 124 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) JJG724-1991《直-5 0410.1Ω,U=1.0?10rel直流电阻 流数字电阻表检 -409 100MΩ ,2.6?10 定规程》 JJG(航天)10mV, 0410.34-1999 750V 见下表 交流电压 02 《交流数字电压(3Hz, 表检定规程》 300kHz) 交流电压 频率(Hz) 电压范围只做 3,55,1010,20k20k,50k50k,100k100k,300k主要 校准-4-4-4-4-3-3(10,100)mVU=2.1?10U=2.1?10U=1.8?10U=1.5?10U=1.1?10U=1.1?10relrelrelrelrelrel参量 1 数字多用表 -4-4-4-4-4-3示值(0.1,1)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10relrelrelrelrelrel误差 -4-4-4-4-4-3的校(1,10)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10relrelrelrelrelrel准 -4-4-4-4-4-3(10,100)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10relrelrelrelrelrel -4-4-4-4-3-3(100,750)VU=1.7?10U=1.7?10U=1.7?10U=3.3?10U=1.0?10U=1.0?10relrelrelrelrelrel (0.01, -43)A U=5.8?10 rel (3-5)Hz JJG(航天)(0.01, 0410.35-1999 3)A -3交流电流 U=1.1?10 rel04 《交流数字电流(5, 表检定规程》 10)Hz (0.01, 3)A -3U=4.9?10 rel10Hz, 5kHz No. CNAS L2874 第 125 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) -310mV,1V U=3.0?10 rel 0410.直流电压 -5 01 U=7.6?10(1,rel -4,7.2?10 1000)V JJG124-2005 0410.10μA,《电流表、电压-3直流电流 U=6.7?10 2 模拟多用表 rel03 5A 表、功率表及电 阻表检定规程》 -2 0410.1Ω,U=2.1?10rel电阻 -409 100MΩ ,6.5?10 0410.10mV,-3交流电压 U=1.5?10 rel02 10V (10,-4U=4.5?10 rel50)V 0410.JJG124-2005 交流电压 02 《电流表、电压2 模拟多用表 (50,表、功率表及电-4U=2.7?10 rel500)V 阻表检定规程》 0410.0.1mA,-3交流电流 U=5.5?10 rel04 5A -3 0410.10mV,U=2.3?10rel直流电压 JJG124-2005 -401 1000V ,8.2?10 《电流表、电压3 电压表 表、功率表及电 -3 阻表检定规程》 0410.10mV,U=3.2?10rel交流电压 -402 1000V ,7.9?10 0410.10μA,JJG124-2005 -3直流电流 U=6.8?10 rel03 5A 《电流表、电压4 电流表 表、功率表及电 阻表检定规程》 0410.-3交流电流 10mA,5A U=7.3?10 rel04 0410.11mW,JJG124-2005 -4直流功率 U=8.5?10 rel05 20kW 《电流表、电压5 功率表 表、功率表及电 阻表检定规程》 0410.110mW,-3交流功率 U=1.1?10 rel05 20kW No. CNAS L2874 第 126 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) U=1.2?rel0.1kΩ,JJG622-1997《绝-310, 不能100MΩ 缘电阻表检定规-32.6?10 绝缘电阻 做的0410.程》 6 兆欧表 项目:(0.1,-209 JJG1005-2005U=2.3?10 rel短路10)GΩ 《电子式绝缘电电流 -2阻表检定规程》 电压 10V,3kV U=1.9?10 rel JJG445-1986《直0409.10mV,-6直流电压 U=7.6?10 流标准电压源检rel01 1000V 定规程》 10μA,-5U=2.1?10 rel多功能校准33mA 7 JJG(航天)源 0409.38-1987 (33,-5直流电流 U=6.5?10 rel03 《直流标准电流330)mA 源检定规程》 (0.33,-4U=5.1?10 rel20)A -5 JJG166-1993《直0409.1Ω,U=1.2?10rel直流电阻 -3流电阻器检定规05 1.1GΩ ,3.5?10 程》 JJG(航天)10mV,2-1999 0409.1000V 见下表 交流电压 《交流标准电压02 (10Hz,源检定规程检定500kHz) 规程》 只做 交流电压主要 频率(Hz)校准电压范围多功能校准参量10,4545,10k10k,20k20k,50k50k,100k100k,500k7 -4-4-4-4-4-3源 示值(10,33)mVU=3.7?10U=2.8?10U=2.8?10U=4.8?10U=6.5?10U=1.4?10relrelrelrelrelrel-4-5-5-4-4-4误差(33,330)mVU=1.2?10U=6.3?10U=6.3?10U=1.0?10U=2.1?10U=5.3?10relrelrelrelrelrel-5-5-5-5-4-4的校(0.33,3.3)VU=7.7?10U=2.9?10U=2.9?10U=5.6?10U=1.9?10U=3.0?10relrelrelrelrelrel准 -4-5-5-5-4-4 (3.3,33)VU=3.8?10U=5.4?10U=5.4?10U=6.8?10U=1.1?10U=2.3?10relrelrelrelrelrel 频率(Hz)电压范围45,1k1k,10k10k,20k20k,50k50k,100k/ -4-5-5-4-4(33,330)VU=2.3?10U=4.0?10U=8.0?10U=1.1?10U=2.4?10/relrelrelrelrel 频率(Hz)电压范围45,1k1k,5k5k,10k/// -4-5-4(330,1000)VU=4.7?10U=4.5?10U=4.4?10///relrelrel No. CNAS L2874 第 127 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) JJG(航天)0.1mA, 0410.51-1999 20A 交流电流 见下表 04 《交流标准电流(10Hz, 源检定规程》 50kHz) 交流电流 频率(Hz)只做电流范围10,2020,4545,1k1k,5k5k,10k10k,30k主要-4-4-4-4-4-4(29,330)μAU=5.9?10U=5.8?10U=5.8?10U=4.7?10U=7.2?10U=8.3?10relrelrelrelrelrel校准-4-4-4-4-4-4(0.33,3.3)mAU=1.6?10U=1.0?10U=3.8?10U=1.2?10U=4.7?10U=7.5?10relrelrelrelrelrel多功能校准参量-4-4-4-4-4-4(3.3,33)mAU=1.4?10U=1.2?10U=1.2?10U=1.2?10U=1.7?10U=4.3?107 relrelrelrelrelrel源 示值-4-5-5-5-4-4(33,330)mAU=1.3?10U=9.9?10U=5.0?10U=9.6?10U=5.8?10U=4.2?10relrelrelrelrelrel误差频率(Hz) 电流范围的校10,4545,1k1k,5k5k,10k//准 -4-4-4-4(0.33,1.1)AU=2.4?10U=2.4?10U=2.3?10U=1.2?10//relrelrelrel-4-4-4-4(1.1,3)AU=2.9?10U=7.8?10U=5.9?10U=2.9?10//relrelrelrel 频率(Hz)电流范围45,100100,1k1k,5k/// -4-4-4(3,11)AU=5.1?10U=4.7?10U=4.7?10///relrelrel-4-4-4(11,20)AU=5.9?10U=5.8?10U=5.8?10///relrelrel 0426.500V,不能-2直流电压 U=3.1?10 rel01 10000V 做的 项目:500V,0426.容量，-2交流电压 U=2.6?10 10000Vrel02 直流(50Hz) JJG795-2004 耐电压 电压0410.(0.1,8 《耐电压测试仪-3直流电流 U=1.6?10 rel测试仪 纹波03 100)mA 检定规程》 系数，(0.1,0410.交流-4交流电流 U=8.0?10 100)mArel04 电压(50Hz) 失真0412.1s,-3持续时间 U=7.7?10 度 rel04 15min 不能 做的JJG982-2003《直-5 0402.0.01Ω,U=1.3?10项目rel9 直流电阻箱 电阻 流电阻箱检定规 -401 100MΩ ,2.6?10 工频程》 耐压 试验 No. CNAS L2874 第 128 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) (0.01,-4U=5.9?10 rel100)mV 0425.直流电压 01 -3 U=5.7?100.1V,rel -4JJG(航,8.2?10 1000V 直流稳压 天)6-1999 10 电源 《直流稳压电压 0425.检定规程》 (0,30)-3直流电流 U=8.7?10 rel01 A 纹波电压有0425.(0.01,-3U=2.6?10 rel效值 02 100)mV JJG(航 直流稳压 纹波电压峰0425.天)6-1999 (0.01,-210 U=3.6?10 rel电源 峰值 02 《直流稳压电压300)mV 检定规程》 0409.-2电压 10mV~20V U=1.6?10 rel01 JJG602-1996 低频信号 0412.10Hz~1MH11 《低频信号发生 -6频率 U=1.8?10 发生器 rel08 z 器检定规程》 0413.0.01%~30-2失真度 U=7?10 rel04 % JJG180-2002 0412.《电子测量仪器5MHz、-912 频率计 频率 U=3.6?10 rel01 内石英晶体振荡10MHz 器检定规程》 0.1mH~100406.-3电感 H U=1.2?10 rel01 GJB/J5412-2005 (1kHz) 《宽量程数字13 LCR测量仪 RLC测量仪检定500pF~1 规程》 0404.μF -3电容 U=7.1?10 rel01 (100Hz~1 kHz) No. CNAS L2874 第 129 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) 0413.-2上升时间 ,500ps U=2.1?10 rel03 扫描时间因0413.-3U=5.1?10 5ns~50s rel数 03 JJG262-1996 14 示波器 《模拟示波器检 定规程》 垂直偏转系0413.-32mV~200V U=6.2?10 rel数 05 0413.DC~1000M频带宽度 U=2.8 rel01 Hz JJG250-1990《电 子电压表检定规10Hz~500 -3 0409.程》 kHz U=1.2?10rel15 电子电压表 基本刻度 -302 GJB/J3411-19981mV~1000,7.2?10 《宽频电子电压V 表检定规程》 JJG250-1990《电 子电压表检定规10Hz~100 -3 0409.程》 0MHz U=3.7?10rel15 电子电压表 频率响应 -202 GJB/J3411-19980.3V~1.5, 1.1?10 《宽频电子电压V 表检定规程》 1514.(-80~300温度 =0.4?U 02 )? JJF1101-2003 环境试验设《环境试验设备16 备 温度、湿度校准 1517.规范》 30%RH~98湿度 U=1.8%RH 02 %RH No. CNAS L2874 第 130 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) (0-25)U=1.4μm mm (25-50)U=1.5μm mm (50-75)U=1.6μm mm (75-100U=1.7μm )mm (100-12U=1.8μm 5)mm (125-15U=1.9μm 0)mm JJG21-2008 1303.(150-1717 外径千分尺 长度 《千分尺检定规=2.0μm U 18 5)mm 程》 (175-20U=2.2μm 0)mm (200-22U=2.3μm 5)mm (225-25U=2.4μm 0)mm (250-27U=2.6μm 5)mm (275-30U=2.7μm 0)mm (300-32U=2.8μm 5)mm (325-35U=2.9μm 0)mm (350-37U=3.2μm JJG21-2008 5)mm 1303.17 外径千分尺 长度 《千分尺检定规 18 (375-40程》 U=3.3μm 0)mm (400-42U=3.4μm 5)mm No. CNAS L2874 第 131 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) (425-45U=3.6μm 0)mm JJG21-2008 1303.(450-4717 外径千分尺 长度 《千分尺检定规 U=3.7μm 18 5)mm 程》 (475-50U=4.0μm 0)mm (0-25)U=1.2μm mm (25-50)JJG26-2001 U=1.6μm 1303.mm 18 杠杆千分尺 长度 《杠杆千分尺、 29 卡规检定规程》 (50-75)U=1.7μm mm (75-100=1.9μm U )mm (5-30) U=1.2μm mm (25-50) U=1.5μm mm (50-75) JJF1091-2002 U=1.7μm 1303.mm 19 内测千分尺 长度 《测量内尺寸千 29 分尺校准规范》 (75-100U=1.8μm ) mm (100-12U=1.9μm 5) mm (125-15U=2.2μm 0) mm (0-25)U=1.2μm mm (25-50)JJG82-2010 U=1.4μm 公法线类 1303.mm 20 长度 《公法线千分尺 千分尺 29 检定规程》 (50-75)U=1.6μm mm (75-100U=1.7μm )mm No. CNAS L2874 第 132 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) (0-25)U =0.8μm mm (25-50)U =0.83μm mm (50-75)U =0.84μm mm (75-100JJG24-2003 U =0.87μm 1303.)mm 21 深度千分尺 长度 《深度千分尺检 29 定规程》 (100-12U =0.95μm 5)mm (125-15U =0.99μm 0)mm (150-17=1.2μm U 5)mm (175-20U =1.2μm 0)mm (0-150)U=8.2μm mm (0-200)U=8.4μm mm JJG30-2012 1303.(0-300)22 通用卡尺 长度 《通用卡尺检定 U =8.6μm 23 mm 规程》 (0-500)U =9.5μm mm (0-1000U =24μm )mm (0-300)U =9.5μm JJG31-2011 1303.mm 23 高度卡尺 长度 《高度卡尺检定 (0-500)29 μ U =15m 规程》 mm 75mm U=0.33μm 125mm JJG63-2007 175mm 1303.24 刀口形直尺 直线度 《刀口形直尺检200mm 03 U=0.50μm 定规程》 225mm 300mm U=0.66μm No. CNAS L2874 第 133 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) (0-3)mm U=3.6μm 百分表 (0-5)mm (0-10)mm U=4.8μm (0-10)mm JJG34-2008 1303.U=5.7μm 25 指示表 长度 《指示表检定规 15 程》 千分表 U=2.2μm (0-1)mm (6-10)U=2.8μm mm (10-18)U=3.5μm mm JJF1102-2003 1303.(18-35)26 内径表 长度 《内径表校准规U=4.8μm 15 mm 范》 (35-50)U=5.3μm mm (50-450U=6.2μm )mm 千分表 U=1.2μm (0-0.2)mJJG35-2008 m 1303.27 杠杆表 长度 《杠杠表检定规 15 百分表 程》 U=2.8μm (0-0.8)m m No. CNAS L2874 第 134 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) 160mm?1 00mm~ =0.6μmU 250mm?1 60mm 250mm?2 50mm~ =0.8μm U 300mm?3 00mm 400mm?2 50mm~ U=1.0μm 630mm?4 00mm 630mm?6 30mm~ U=1.2μm 800mm?5JJG117-2005 1303.00mm 28 平板 平面度 《平板检定规 01 程》 800mm?8 00mm~ U=1.5μm 1000mm? 750mm 1000mm? U=1.8μm 1000mm 1250mm? 1250mm~1U=2.1μm 600mm?1 600mm 2000mm?U=2.6μm 1500mm 3000mm?U=3.2μm 2000mm JJG33-2002 1303.0?-32029 万能角度尺 角度 U=0.92’ 《万能角度尺检06 ? 定》 Q/HKT 10-2008 1303.《惯性测量组合0?-36030 三轴转台 角度 U=0.42" 29 综合测试系统校? 准规范》 No. CNAS L2874 第 135 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 扩展不确定序测量仪器名领域规范代号(含年限制校准参量 测量范围 度(校准和测备注 号 称 代码 号)名称 说明 量能力，k=2) U=(0.20+2?(0.5-100-6 10L)μm )mm JJG146-2011 1308. L-mm 31 量块 长度 《量块检定规 04 U=(0.50+5?程》 (30-500)-6 10L)μm mm L-mm JJG7-2004 1303.(315?232 宽座直角尺 角度 《直角尺检定规U =1.8μm 04 00)mm 程》 No. CNAS L2874 第 136 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 CHINA NATIONAL ACCREDITATION SERVICE FOR CONFORMITY ASSESSMENT APPENDIX OF ACCREDITATION CERTIFICATE (Registration No. CNAS L2874) NAME:Metrology & Measurement Center of Hunan Spaceflight Management Bureau ADDRESS:No.217, Fenglin Sanlu, Yuelu District, Changsha, Hunan, China Accreditation Criteria:ISO/IEC 17025:2005 and relevant requirements of CNAS Date of Issue:2012-03-27 Date of Expiry:2015-03-26 Date of Update:2013-06-04 APPENDIX 3 ACCREDITED CALIBRATION Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field V.R. of DC Digital 0410.010mV,-6U=8.3×10 DC voltage Voltmeter rel1 1000V JJG315-1983 Only the (0.1,-5U=6.5×10 relmain 100)mA calibra-tV.R. of DC Digital Digital 0410.0ion DC current Amperemeter 1 3 parametAll-porpuse Meter JJG598-1989 er indicatio-4U=6.9×10 (0.1,3)A reln error V.R. of DC Digital -5 U=1.0×10rel0410.01Ω,100MResistance Ohmmeter -49 Ω ,2.6×10 JJG724-1991 No. CNAS L2874 第 137 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field V.R. for AC digital 10mV, 0410.0Voltmeter 750V AC voltage View in next list 2 JJG(Spaceflight)(3Hz, 34-1999 300kHz) AC voltage Frequency(Hz) Voltage Range 3,55,1010,20k20k,50k50k,100k100k,300k -4-4-4-4-3-3Only the (10,100)mVU=2.1?10U=2.1?10U=1.8?10U=1.5?10U=1.1?10U=1.1?10relrelrelrelrelrelmain -4-4-4-4-4-3calibra-t(0.1,1)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10 relrelrelrelrelrelDigital ion 1 -4-4-4-4-4-3parametAll-porpuse Meter (1,10)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10 relrelrelrelrelreler -4-4-4-4-4-3indicatio(10,100)VU=1.6?10U=1.6?10U=1.3?10U=3.0?10U=8.9?10U=5.8?10relrelrelrelrelrel n error -4-4-4-4-3-3 (100,750)VU=1.7?10U=1.7?10U=1.7?10U=3.3?10U=1.0?10U=1.0?10relrelrelrelrelrel V.R. for AC digital 0410.0Current Meter (0.01,3)A -4AC Current U=5.8×10 rel4 JJG(Spaceflight )(3-5)Hz 35-1999 (0.01,3)A V.R. for AC digital -3U=1.1×10 rel(5,10)Hz 0410.0Current Meter AC Current 4 JJG(Spaceflight )(0.01,3)A -3U=4.9×10 rel35-1999 10Hz,5kHz -310mV,1V U=3.0×10 rel0410.0DC voltage -5 1 U=7.6×10rel(1,1000)V -4,7.2×10 0410.0-3DC current 10μA,5A U=6.7×10 rel3 V.R. of -2 0410.01Ω,100MU=2.1×10relResistance Amperemeters,Voltme-49 Ω ,6.5×10 Simulation ters,Wattmeters and 2 All-purpose Meter -3Ohmmeters 10mV,10V U=1.5×10 rel JJG124-2005 0410.0-4AC voltage (10,50)V U=4.5×10 rel2 -4(50,500)V U=2.7×10 rel 0410.0-3AC Current 0.1mA,5A U=5.5×10 rel4 No. CNAS L2874 第 138 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field V.R. of -3 0410.010mV,U=2.3×10relDC voltage Amperemeters,Voltme-41 1000V ,8.2×10 ters,Wattmeters and 3 Voltage Meter Ohmmeters -3 JJG124-2005 0410.010mV,U=3.2×10relAC voltage -42 1000V ,7.9×10 V.R. of 0410.0-3DC current 10μA,5A U=6.8×10 Amperemeters,Voltmerel3 ters,Wattmeters and 4 Current Meter Ohmmeters JJG124-2005 0410.0-3AC Current 10mA,5A U=7.3×10 rel4 V.R. of 0410.011mW,-4DC POWER U=8.5×10 Amperemeters,Voltmerel5 20kW ters,Wattmeters and 5 Power Meter Ohmmeters 0410.0110mW,-3AC POWER U=1.1×10 relJJG124-2005 5 20kW V.R. of Megohmmeter JJG622-1997 -3Can not Insulated 0410.0V.R. of Electronic 0.1kΩ,U=1.2×10, rel Megohm Meter -3do the Resistance 9 Insulating Resistance 100MΩ 2.6×10 project: Meters 6 Short JJG1005-2005 circuit (0.1,10)G-2 U=2.3×10 relcurrent Ω -2Voltage 10V,3kV U=1.9×10 rel V.R. of DC Standard 0409.010mV,-6DC voltage Voltage Source U=7.6×10 relOnly the 1 1000V JJG445-1986 main calibrati Multifunc-tional on 7 parametCalibra-tion 10μA,-5V.R. for Direct U=2.1×10 reler 33mA Fountain Current Standard 0409.0indicatio(33,-5DC current Source JJGU=6.5×10 rel3 n error 330)mA (Spaceflight) -438-1987 (0.33,20)A U=5.1×10 rel -5 DC 0409.0V.R. of D.C. Resistors 1Ω,1.1GU=1.2×10rel -3Resistance 5 JJG166-1993 Ω ,3.5×10 No. CNAS L2874 第 139 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field V.R. for AC Standard 10mV, 0409.0Voltage Source 1000V AC voltage View in next list 2 JJG(Spaceflight)(10Hz, 2-1999 500kHz) AC voltage Frequency(Hz) Voltage Range10,4545,10k10k,20k20k,50k50k,100k100k,500k -4-4-4-4-4-3 (10,33)mVU=3.7?10U=2.8?10U=2.8?10U=4.8?10U=6.5?10U=1.4?10relrelrelrelrelrel-4-5-5-4-4-4 (33,330)mVU=1.2?10U=6.3?10U=6.3?10U=1.0?10U=2.1?10U=5.3?10relrelrelrelrelrel -5-5-5-5-4-4(0.33,3.3)VU=7.7?10U=2.9?10U=2.9?10U=5.6?10U=1.9?10U=3.0?10relrelrelrelrelrel -4-5-5-5-4-4(3.3,33)VU=3.8?10U=5.4?10U=5.4?10U=6.8?10U=1.1?10U=2.3?10 relrelrelrelrelrel Frequency(Hz)Voltage Range 45,1k1k,10k10k,20k20k,50k50k,100k/ -4-5-5-4-4(33,330)VU=2.3?10U=4.0?10U=8.0?10U=1.1?10U=2.4?10/relrelrelrelrel Frequency(Hz)Voltage Range 45,1k1k,5k5k,10k/// -4-5-4(330,1000)VU=4.7?10U=4.5?10U=4.4?10///relrelrel Multifunc-tional 7 V.R. for AC Standard 0.1mA,Calibra-tion 0410.0Current Source 20A Fountain AC Current View in next list 4 JJG(Spaceflight)(10Hz, 51-1999 50kHz) AC Current Frequency(Hz)Current Range 10,2020,4545,1k1k,5k5k,10k10k,30k -4-4-4-4-4-4(29,330)μAU=5.9?10U=5.8?10U=5.8?10U=4.7?10U=7.2?10U=8.3?10relrelrelrelrelrel -4-4-4-4-4-4(0.33,3.3)mAU=1.6?10U=1.0?10U=3.8?10U=1.2?10U=4.7?10U=7.5?10relrelrelrelrelrel -4-4-4-4-4-4(3.3,33)mAU=1.4?10U=1.2?10U=1.2?10U=1.2?10U=1.7?10U=4.3?10relrelrelrelrelrel -4-5-5-5-4-4 (33,330)mAU=1.3?10U=9.9?10U=5.0?10U=9.6?10U=5.8?10U=4.2?10relrelrelrelrelrel Frequency(Hz)Current Range 10,4545,1k1k,5k5k,10k// -4-4-4-4(0.33,1.1)AU=2.4?10U=2.4?10U=2.3?10U=1.2?10//relrelrelrel -4-4-4-4(1.1,3)AU=2.9?10U=7.8?10U=5.9?10U=2.9?10// relrelrelrel Frequency(Hz)Current Range 45,100100,1k1k,5k/// -4-4-4(3,11)AU=5.1?10U=4.7?10U=4.7?10///relrelrel -4-4-4(11,20)AU=5.9?10U=5.8?10U=5.8?10///relrelrel No. CNAS L2874 第 140 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field Can not do the project: Actual 0426.0500V,-2DC voltage U=3.1×10 reloutput 1 10000V capacity, DC voltage V.R. of Withstanding ripple Endure Voltage Voltage Testers coeffic-i8 Tester JJG795-2004 ent, AC voltage distortio 500V,n, 0426.0-2AC voltage 10000VU=2.6×10 Dielectrirel2 (50Hz) c 0410.0(0.1,strength -3DC current U=1.6×10 rel3 100)mA test (0.1,0410.0-4AC Current 100)mAU=8.0×10 rel4 (50Hz) 0412.0-3Duration 1s,15min U=7.7×10 rel4 Can not do the V.R. of D.C. project: -5 DC Resistance 0402.00.01Ω,U=1.3×10relResistance Resistance Box Dielectri 9 -41 100MΩ ,2.6×10 Case JJG982-2003 c strength test (0.01,-4U=5.9×10 rel100)mV 0425.0DC voltage 1 V.R. for DC Voltage -3 0.1V,U=5.7×10relDC Firm Voltage Stable Source -41000V ,8.2×10 10 JJG(Spaceflight )6-19Power 0425.0-399 DC current 0,30A U=8.7×10 rel1 Veins Wave 0425.0(0.01,-3Voltage U=2.6×10 rel2 100)mV Virtual Value No. CNAS L2874 第 141 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field V.R. for DC Voltage Veins Wave DC Firm Voltage 0425.0Stable Source (0.01,-2Voltage U=3.6×10 10 rel2 JJG(Spaceflight )6-19300)mV Power Peak Value 99 0409.0-2Voltage 10mV~20V U=1.6 ×10 rel1 V.R. of Low Frequency Low-frequency Signal 11 0412.0Generator Signal Generator -6Frequency 10Hz~1MHz U=1.8×10 rel8 JJG602-1996 0413.0-2Distortion 0.01%~30% U=7×10 rel4 V.R. of Crystal Oscillator Inside the 0412.0Electrical 5MHz、-9Frequency U=3.6×10 12 Frenquency Meter 1 Measurement 10MHz Instrument JJG180-2002 0406.00.1mH~10H -3Inductance U=1.2×10 rel1 (1kHz) V.R. for Wide Range LCR Measure Digital RLC Meter 13 500pF~1μF Meter GJB/J5412-2005 0404.0-3Capacit-ance (100Hz~1kHU=7.1×10 rel1 z) 0413.0-2Rise up time ,500ps U=2.1×10 V.R. of Analogue rel3 Osilloscope 14 Oscillogr-agh JJG262-1996 Scan time 0413.0-35ns~50s U=5.0×10 relsubmultiple 3 Aplomb 0413.0-3deflexion 2mV~200V U=6.2×10 V.R. of Analogue rel5 quotiety Osilloscope 14 Oscillog-ragh JJG262-1996 Frequency 0413.0DC~1000MU=2.8 relband wide 1 Hz 10Hz~ V.R. of Electronic -3 The basic U=1.2×10rel500kHz Voltmeter -3scale ,7.2×10 Electronic 1mV~1000V 0409.0JJG250-1990 15 2 V.R. for Wide Band Voltmeter Electronic Voltmeter 10Hz~ -3 GJB/J3411-1998 Frequency U=3.7×10rel1000MHz -2response , 1.1×10 0.3V~1.5V No. CNAS L2874 第 142 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field C.S. for the Equipment of the 1514.0Environm-ent Temperature (-80~300)? U=0.4? Environmental 2 Testing for 16 Examinat-ion Temperarure and Equipment Humidity JJF1101-2003 1517.030%RH~98Humidity U=1.8%RH 2 %RH (0-25)mm U=1.4μm (25-50)mm U=1.5μm (50-75)mm U=1.6μm (75-100)U=1.7μm mm (100-125)U=1.8μm mm (125-150)U=1.9μm mm (150-175)U=2.0μm mm (175-200)U=2.2μm mm (200-225)U=2.3μm mm (225-250)Outer Dia. 1303.1V.R. of Micrometer U=2.4μm Length 17 mm 8 JJG21-2008 Micromet-er (250-275)U=2.6μm mm (275-300)U=2.7μm mm (300-325)U=2.8μm mm (325-350)U=2.9μm mm (350-375)U=3.2μm mm (375-400)U=3.3μm mm (400-425)U=3.4μm mm (425-450)U=3.6μm mm (450-475)U=3.7μm mm No. CNAS L2874 第 143 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field Outer Dia. 1303.1V.R. of Micrometer (475-500)Length U=4.0μm 17 8 JJG21-2008 mm Micromet-er (0-25)mm U=1.2μm V.R. of the The Micromete-rs Micrometers with 1303.2Length Dial Comparator and 18 with Dial 9 (25-50)mm U=1.6μm Indicating Snap Comparat-or Gauge JJG26-2001 (50-75)mm U=1.7μm (75-100)U=1.9μm mm (5-30) mm U=1.2μm (25-50) U=1.5μm mm C.S. for Micrometers Micrometers for (50-75) 1303.2for Measuring Inside U=1.7μm Length 19 Measuring Inside mm 9 Dimension Dimension JJF1091-2002 (75-100) U=1.8μm mm (100-125) U=1.9μm mm (125-150) U=2.2μm mm (0-25)mm U =0.8μm (25-50)mm U =0.83μm (50-75)mm U =0.84μm (75-100)V.R. of Common U =0.87μm Common Normal 1303.2mm Length Normal Micrometer 20 9 (100-125)Micromet-er JJG82-2010 U =0.95μm mm (125-150)U =0.99μm mm (150-175)U =1.2μm mm (175-200)U =1.2μm mm V.R. of Depth Depth 1303.2Length Micrometers (0-25)mm U =0.8μm 21 9 Micromet-er JJG24-2003 No. CNAS L2874 第 144 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field (25-50)mm U =0.83μm (50-75)mm U =0.84μm (75-100)U =0.87μm mm V.R. of Depth Depth 1303.2(100-125)Length Micrometers 21 U =0.95μm 9 Micromet-er mm JJG24-2003 (125-150)U =0.99μm mm (150-175)U =1.2μm mm (175-200)U =1.2μm mm (0-150)mm U=8.2μm (0-200)mm U=8.4μm V.R. of Current 1303.2Length Calipers 22 Currency Calipers 3 (0-300)mm U =8.6μm JJG30-2012 (0-500)mm U =9.5μm (0-1000)U =24μm mm (0-300)mm U =9.5μm 1303.2V.R. of Height Caliper Length 23 Height Calipers 9 JJG31-2011 (0-500)mm U =15μm 75mm 125mm U=0.33μm 175mm 1303.0V.R. of Straight Edge Beeline 24 Straight Edge 200mm 3 JJG63-2007 U=0.50μm 225mm 300mm U=0.66μm Dial indicator (0-3)mm U=3.6μm (Reading (0-5)mm U=4.8μm 0.01mm) (0-10)mm U=5.7μm (0-10)mm 1303.1V.R. of Dial Gauges Length 25 Dial Gauges 5 JJG34-2008 Dial indicator (Reading U=2.2μm 0.001mm) (0-1)mm No. CNAS L2874 第 145 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field (6-10)mm U=2.8μm (10-18)mm C.S. for Bore Dial U=3.5μm Bore Dial 1303.1(18-35)mm Length Indicators U=4.8μm 26 5 (35-50)mm Indicat-ors JJF1102-2003 U=5.3μm (50-450)U=6.2μm mm Dial indicator (Reading U=1.2μm 0.001mm) (0-0.2)mm 1303.1V.R. of Dial Gauges Length 27 Dial Gauges 5 JJG34-2008 Dial indicator (Reading U=3.8μm 0.01mm) (0-0.8)mm 160mm×100 mm~ U=0.6μm 250mm×160 mm 250mm×250 mm~ U=0.8μm 300mm×300 mm 400mm×250 mm~ U=1.0μm 630mm×400 mm 630mm×630 mm~ U=1.2μm 800mm×500V.R. of Surface 1303.0mm Plane Degree Plates 28 Surface Plates 1 JJG117-2005 800mm×800 mm~ U=1.5μm 1000mm×75 0mm 1000mm×10 00mm U=1.8μm 1250mm×12 50mm~1600U=2.1μm mm×1600m m 2000mm×15U=2.6μm 00mm 3000mm×20U=3.2μm 00mm No. CNAS L2874 第 146 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 Code Title, Code of Uncertainty Limitati? Instrument Parameter of Range Note Calibration Method (CMC, k=2) on Field V.R. of Universal Universal Bevel 1303.0Angle Bevel Protractors 0?-320? U=0.92’ 29 6 Protract-ors JJG33-2002 C.S. for inertia Rotate Platform 1303.2measure combination Angle 0?-360? U=0.42" 30 9 colligation test system With 3 Axeses Q/HKT 10-2008 -6U=(0.20+2×10L)μm (0.5-100)mm L-mm 1308.0V.R. of Gauge Block Length 31 Gauge Block 4 JJG146-2011 -6U=(0.50+5×10L)μm (30-500)mm L-mm 1303.0V.R. of Squares (315?Angle U =1.8μm 32 Wide Seat Square 4 JJG7-2004 200)mm No. CNAS L2874 第 147 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only. ISO/IEC 17025 认可证书 CNAS-PD20/09-B/1 No. CNAS L2874 第 148 页 共 148 页 Should there be any inconsistencies between Chinese and English versions of the scope of accreditation, the Chinese version shall prevail in that the English version is provided by the conformity assessment body and is for reference only.