04/20/2010
IRFH6200PbF
HEXFET��Power MOSFET
Notes�� through � are on page 8
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Features and Benefits
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PQFN 5X6 mm
Note
Form Quantity
IRFH6200TRPBF PQFN 5mm x 6mm Tape and Reel 4000
IRFH6200TR2PBF PQFN 5mm x 6mm Tape and Reel 400
Orderable part number Package Type Standard Pack
Applications
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Features Resulting Benefits
Low RDSon (≤ 1.20mΩ) Lower Conduction Losses
Low Thermal Resistance to PCB (≤ 0.5°C/W) Enable better thermal dissipation
Low Profile (≤ 0.9 mm) results in Increased Power Density
Industry-Standard Pinout ⇒ Multi-Vendor Compatibility
Compatible with Existing Surface Mount Techniques Easier Manufacturing
RoHS Compliant Containing no Lead, no Bromide and no Halogen Environmentally Friendlier
VDS 20 V
RDS(on) max
(@VGS = 4.5V)
1.20 mΩ
RDS(on) max
(@VGS = 2.5V)
1.50 mΩ
Absolute Maximum Ratings
Parameter Units
VDS Drain-to-Source Voltage
VGS Gate-to-Source Voltage
ID @ TA = 25°C Continuous Drain Current, VGS @ 4.5V
ID @ TA = 70°C Continuous Drain Current, VGS @ 4.5V
ID @ TC(Bottom) = 25°C Continuous Drain Current, VGS @ 4.5V
ID @ TC(Bottom) = 100°C Continuous Drain Current, VGS @ 4.5V
IDM Pulsed Drain Current �
PD @TA = 25°C Power Dissipation �
PD @TC(Bottom) = 25°C Power Dissipation �
Linear Derating Factor � W/°C
TJ Operating Junction and
TSTG Storage Temperature Range
-55 to + 150
3.6
0.029
250
Max.
45
100
400
±12
20
36
100
V
W
A
°C
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S
D
G
Thermal Resistance
Parameter Typ. Max. Units
RθJC (Bottom) Junction-to-Case � ––– 0.5
RθJC (Top) Junction-to-Case � ––– 15 °C/W
RθJA Junction-to-Ambient � ––– 35
RθJA (<10s) Junction-to-Ambient � ––– 22
Static @ TJ = 25°C (unless otherwise specified)
Parameter Min. Typ. Max. Units
BVDSS Drain-to-Source Breakdown Voltage 20 ––– ––– V
∆ΒVDSS/∆TJ Breakdown Voltage Temp. Coefficient ––– 6.4 ––– mV/°C
RDS(on) Static Drain-to-Source On-Resistance ––– 0.80 1.20
––– 1.10 1.50
VGS(th) Gate Threshold Voltage 0.5 0.8 1.1 V
∆VGS(th) Gate Threshold Voltage Coefficient ––– -6.6 ––– mV/°C
IDSS Drain-to-Source Leakage Current ––– ––– 1.0
––– ––– 150
IGSS Gate-to-Source Forward Leakage ––– ––– 100
Gate-to-Source Reverse Leakage ––– ––– -100
gfs Forward Transconductance 260 ––– ––– S
Qg Total Gate Charge ––– 155 230 VDS = 10V
Qgs Gate-to-Source Charge ––– 22 –––
Qgd Gate-to-Drain Charge ––– 53 –––
RG Gate Resistance ––– 1.3 ––– Ω
td(on) Turn-On Delay Time ––– 14 –––
tr Rise Time ––– 74 –––
td(off) Turn-Off Delay Time ––– 140 –––
tf Fall Time ––– 160 –––
Ciss Input Capacitance ––– 10890 –––
Coss Output Capacitance ––– 2890 –––
Crss Reverse Transfer Capacitance ––– 2180 –––
Avalanche Characteristics
Parameter Units
EAS Single Pulse Avalanche Energy � mJ
IAR Avalanche Current � A
Diode Characteristics
Parameter Min. Typ. Max. Units
IS Continuous Source Current
(Body Diode)
ISM Pulsed Source Current
(Body Diode)��
VSD Diode Forward Voltage ––– ––– 1.2 V
trr Reverse Recovery Time ––– 86 130 ns
Qrr Reverse Recovery Charge ––– 350 525 nC
ton Forward Turn-On Time Time is dominated by parasitic Inductance
MOSFET symbol
nA
ns
A
pF
nC VGS = 4.5V
–––
VGS = 12V
VGS = -12V
––– ––– 400
––– ––– 100
Conditions
VGS = 0V, ID = 250µA
Reference to 25°C, ID = 1mA
VGS = 4.5V, ID = 50A �
Conditions
See Fig.15
Max.
780
30
ƒ = 1.0MHz
TJ = 25°C, IF = 50A, VDD = 10V
di/dt = 260A/µs ��
TJ = 25°C, IS = 50A, VGS = 0V �
showing the
integral reverse
p-n junction diode.
–––
RG=1.0Ω
VDS = 10V, ID = 50A
VDS = 16V, VGS = 0V, TJ = 125°C
µA
ID = 50A (See Fig.17 & 18)
ID = 50A
VGS = 0V
VDS = 10V
VDS = 16V, VGS = 0V
VDS = VGS, ID = 150µA
VGS = 2.5V, ID = 50A �
Typ.
mΩ
VDD = 10V, VGS = 4.5V
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Fig 4. Normalized On-Resistance vs. Temperature
Fig 2. Typical Output CharacteristicsFig 1. Typical Output Characteristics
Fig 3. Typical Transfer Characteristics
Fig 6. Typical Gate Charge vs.Gate-to-Source VoltageFig 5. Typical Capacitance vs.Drain-to-Source Voltage
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
1
10
100
1000
I D
, D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
VGS
TOP 10V
4.5V
3.5V
2.5V
2.0V
1.8V
1.5V
BOTTOM 1.3V
≤60µs PULSE WIDTH
Tj = 25°C
1.3V
0.1 1 10 100
VDS, Drain-to-Source Voltage (V)
10
100
1000
I D
, D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
1.3V
≤60µs PULSE WIDTH
Tj = 150°C
VGS
TOP 10V
4.5V
3.5V
2.5V
2.0V
1.8V
1.5V
BOTTOM 1.3V
0.5 1.0 1.5 2.0 2.5
VGS, Gate-to-Source Voltage (V)
1.0
10
100
1000
I D
, D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
TJ = 25°C
TJ = 175°C
VDS = 50V
≤60µs PULSE WIDTH
-60 -40 -20 0 20 40 60 80 100 120 140 160
TJ , Junction Temperature (°C)
0.6
0.8
1.0
1.2
1.4
1.6
R
D
S
(o
n)
,
D
ra
in
-t
o-
S
ou
rc
e
O
n
R
es
is
ta
nc
e
(
N
or
m
al
iz
ed
)
ID = 50A
VGS = 4.5V
1 10 100
VDS, Drain-to-Source Voltage (V)
1000
10000
100000
C
, C
ap
ac
ita
nc
e
(p
F
)
VGS = 0V, f = 1 MHZ
Ciss = Cgs + Cgd, C ds SHORTED
Crss = Cgd
Coss = Cds + Cgd
Coss
Crss
Ciss
0 100 200 300 400
QG, Total Gate Charge (nC)
0.0
2.0
4.0
6.0
8.0
10.0
12.0
14.0
V
G
S
, G
at
e-
to
-S
ou
rc
e
V
ol
ta
ge
(
V
)
VDS= 16V
VDS= 10V
ID= 50A
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Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case (Bottom)
Fig 8. Maximum Safe Operating Area
Fig 9. Maximum Drain Current vs.
Case (Bottom) Temperature
Fig 7. Typical Source-Drain Diode Forward Voltage
Fig 10. Threshold Voltage vs. Temperature
0.0 0.2 0.4 0.6 0.8 1.0 1.2
VSD, Source-to-Drain Voltage (V)
1.0
10
100
1000
I S
D
, R
ev
er
se
D
ra
in
C
ur
re
nt
(
A
)
TJ = 25°C
TJ = 150°C
VGS = 0V
0 1 10 100
VDS, Drain-to-Source Voltage (V)
1
10
100
1000
I D
,
D
ra
in
-t
o-
S
ou
rc
e
C
ur
re
nt
(
A
)
OPERATION IN THIS AREA
LIMITED BY RDS(on)
Tc = 25°C
Tj = 150°C
Single Pulse
100µsec1msec
10msec
DC
-75 -50 -25 0 25 50 75 100 125 150
TJ , Temperature ( °C )
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
V
G
S
(t
h)
, G
at
e
th
re
sh
ol
d
V
ol
ta
ge
(
V
)
ID = 150µA
ID = 500µA
ID = 1.0mA
ID = 1.0A
1E-006 1E-005 0.0001 0.001 0.01 0.1
t1 , Rectangular Pulse Duration (sec)
0.0001
0.001
0.01
0.1
1
T
he
rm
al
R
es
po
ns
e
(
Z
th
JC
)
°
C
/W
0.20
0.10
D = 0.50
0.02
0.01
0.05
SINGLE PULSE
( THERMAL RESPONSE ) Notes:
1. Duty Factor D = t1/t2
2. Peak Tj = P dm x Zthjc + Tc
25 50 75 100 125 150
TC , Case Temperature (°C)
0
100
200
300
400
I D
,
D
ra
in
C
ur
re
nt
(
A
)
Limited By Package
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Fig 13. Maximum Avalanche Energy vs. Drain CurrentFig 12. On-Resistance vs. Gate Voltage
Fig 14b. Unclamped Inductive WaveformsFig 14a. Unclamped Inductive Test Circuit
tp
V(BR)DSS
IAS
RG
IAS
0.01Ωtp
D.U.T
LVDS
+
- VDD
DRIVER
A
15V
20V
Fig 15a. Switching Time Test Circuit Fig 15b. Switching Time Waveforms
VGS
VDS
90%
10%
td(on) td(off)tr tf
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25 50 75 100 125 150
Starting TJ , Junction Temperature (°C)
0
500
1000
1500
2000
2500
3000
3500
E
A
S
,
S
in
gl
e
P
ul
se
A
va
la
nc
he
E
ne
rg
y
(m
J) ID
TOP 19A
21A
BOTTOM 30A
0 2 4 6 8 10 12
VGS, Gate -to -Source Voltage (V)
0
1
2
3
4
R
D
S
(o
n)
,
D
ra
in
-t
o
-S
ou
rc
e
O
n
R
es
is
ta
nc
e
(m
Ω
)
ID = 50A
TJ = 25°C
TJ = 125°C
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Fig 16. ���#�������$���%�����%&���'���� ���"���for N-Channel
HEXFET��Power MOSFETs
Fig 17. Gate Charge Test Circuit Fig 18. Gate Charge Waveform
Vds
Vgs
Id
Vgs(th)
Qgs1 Qgs2 Qgd Qgodr
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P.W.
Period
di/dt
Diode Recovery
dv/dt
Ripple ≤ 5%
Body Diode Forward Drop
Re-Applied
Voltage
Reverse
Recovery
Current
Body Diode Forward
Current
VGS=10V
VDD
ISD
Driver Gate Drive
D.U.T. ISD Waveform
D.U.T. VDS Waveform
Inductor Curent
D = P.W.Period
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PQFN 5x6 Outline "B" Package Details
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http://www.irf.com/technical-info/appnotes/an-1154.pdf
Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/
PQFN 5x6 Outline "B" Part Marking
XXXX
XYWWX
XXXXX
INTERNATIONAL
RECTIFIER LOGO
PART NUMBER
(“4 or 5 digits”)
MARKING CODE
(Per Marking Spec)
ASSEMBLY
SITE CODE
(Per SCOP 200-002)
DATE CODE
PIN 1
IDENTIFIER
LOT CODE
(Eng Mode - Min last 4 digits of EATI#)
(Prod Mode - 4 digits of SPN code)
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� Qualification standards can be found at International Rectifier’s web site
http://www.irf.com/product-info/reliability
�� Higher qualification ratings may be available should the user have such requirements.
Please contact your International Rectifier sales representative for further information:
http://www.irf.com/whoto-call/salesrep/
��� Applicable version of JEDEC standard at the time of product release.
��
���
� Repetitive rating; pulse width limited by max. junction temperature.
� Starting TJ = 25°C, L = 1.7mH, RG = 25Ω, IAS = 30A.
� Pulse width ≤ 400µs; duty cycle ≤ 2%.
� Rθ is measured at ������������
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� When mounted on 1 inch square 2 oz copper pad on 1.5x1.5 in. board of FR-4 material.
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105
TAC Fax: (310) 252-7903
Visit us at www.irf.com for sales contact information.04/2010
Data and specifications subject to change without notice.
PQFN 5x6 Outline "B" Tape and Reel
MS L1
(per JEDEC J-S T D-020D††† )
RoHS compliant Yes
PQFN 5mm x 6mm
Qualification information†
Moisture Sensitivity Level
Qualification level
Industrial††
(per JEDEC JES D47F ††† guidelines )